Search Results - Chorng-Wei Liaw

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  1. 1
    Pinch-Off Voltage-Adjustable High-Voltage Junction Field-Effect Transistor

    Pinch-Off Voltage-Adjustable High-Voltage Junction Field-Effect Transistor by LIAW, Chomg-Wei, YEH, Leaf, LIN, Ming-Jang, CHRONG JUNG LIN

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  2. 2
    Trench Termination Design and Analysis in Low-Voltage N-Channel Trench Power Metal–Oxide–Semiconductor Field-Effect Transistor

    Trench Termination Design and Analysis in Low-Voltage N-Channel Trench Power Metal–Oxide–Semiconductor Field-Effect Transistor by Liaw, Chorng-Wei, Yeh, Leaf, Lin, Ming-Jang, Lin, Chrong Jung

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  3. 3
    Lateral Superjunction Reduced Surface Field Structure for the Optimization of Breakdown and Conduction Characteristics in a High-Voltage Lateral Double Diffused Metal Oxide Field Effect Transistor

    Lateral Superjunction Reduced Surface Field Structure for the Optimization of Breakdown and Conduction Characteristics in a High-Voltage Lateral Double Diffused Metal Oxide Field E... by Lin, Ming-Jang, Lee, Tsung-Hwang, Chang, Fang-Long, Liaw, Chorng-Wei, Cheng, Huang-Chung

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  4. 4
    Characterizing Trench-Gate Power Metal–Oxide–Semiconductor Field Effect Transistor with Multi-Layer Dielectrics at the Trench Bottom

    Characterizing Trench-Gate Power Metal–Oxide–Semiconductor Field Effect Transistor with Multi-Layer Dielectrics at the Trench Bottom by Lin, Ming-Jang, Liaw, Chorng-Wei, Chang, Fang-Long, Cheng, Huang-Chung

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  5. 5
    P-Channel Lateral Double-Diffused Metal–Oxide–Semiconductor Field-Effect Transistor with Split N-Type Buried Layer for High Breakdown Voltage and Low Specific On-Resistance

    P-Channel Lateral Double-Diffused Metal–Oxide–Semiconductor Field-Effect Transistor with Split N-Type Buried Layer for High Breakdown Voltage and Low Specific On-Resistance by Liaw, Chorng-Wei, Chang, Ching-Hung, Lin, Ming-Jang, King, Ya-Ching, Hsu, Charles Ching-Hsiang, Lin, Chrong Jung

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  6. 6
    Investigation of the gate dielectric oxidation treatment in trench gate power devices

    Investigation of the gate dielectric oxidation treatment in trench gate power devices by Ming-Jang Lin, Chorng-Wei Liaw, Jiun-Jye Chang, Fang-Long Chang, Hsu, C.C.H., Huang-Chung Cheng

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