Search Results - Chouprik, A.А.

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    Resistive switching effect in HfxAl1−xOy with a graded Al depth profile studied by hard X-ray photoelectron spectroscopy

    Resistive switching effect in HfxAl1−xOy with a graded Al depth profile studied by hard X-ray photoelectron spectroscopy by Matveyev, Yu.А., Markeev, A.M., Lebedinskii, Yu.Yu, Chouprik, A.А., Egorov, K.V., Drube, W., Zenkevich, A.V.

    Published in Thin solid films
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