Search Results - Cin, Li-Gong

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  1. 1
    Back-Biasing to Performance and Reliability Evaluation of UTBB FDSOI, Bulk FinFETs, and SOI FinFETs

    Back-Biasing to Performance and Reliability Evaluation of UTBB FDSOI, Bulk FinFETs, and SOI FinFETs by Chang, Wen-Teng, Shih, Cheng-Ting, Wu, Jhao-Lin, Lin, Shih-Wei, Cin, Li-Gong, Yeh, Wen-Kuan

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  2. 2
    Hot carrier injection on back biasing double-gate FinFET with 10 and 25-nm fin width

    Hot carrier injection on back biasing double-gate FinFET with 10 and 25-nm fin width by Wen-Teng Chang, Li-Gong Cin, Wen-Kuan Yeh, Po-Ying Chen

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  3. 3
    Impact of Fin Width and Back Bias Under Hot Carrier Injection on Double-Gate FinFETs

    Impact of Fin Width and Back Bias Under Hot Carrier Injection on Double-Gate FinFETs by Chang, Wen-Teng, Cin, Li-Gong, Yeh, Wen-Kuan

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  4. 4
    The Association of MMP-8 Genotypes with Pterygium

    The Association of MMP-8 Genotypes with Pterygium by Hu, Pei-Shin, Chang, Wen-Shin, Chou, An-Kuo, Hsia, Ning-Yi, Hung, Yi-Wen, Lin, Chia-Wen, Wu, Cin-Wun, Huang, Chung-Yu, Wu, Meng-Feng, Liao, Cheng-Hsi, Tsai, Chia-Wen, Bau, DA-Tian, Gong, Chi-Li

    Published in In vivo (Athens)
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