Network processor requirements and benchmarking by Arts, F., Barri, P., Clemminck, I., Niemegeers, A., Pauwels, B., Taildeman, G., Vrana, M.

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Building-in reliability during library development: Hot-carrier degradation is no longer a problem of the technologists only by Bellens, R., Clemminck, I., Van Doorselaer, K.

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Reliability of a focused ion beam repair on digital cmos circuits by Van Camp, R, Van Doorselaer, K, Clemminck, I

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Solid-state coulometric titration study of sputtered CuxS layers by VERVAET, A, CLEMMINCK, I, BURGELMAN, M

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On the interpretation of solid-state coulometry, used in studies of thin films of copper sulphide by VERVAET, A, BURGELMAN, M, CLEMMINCK, I

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Solid‐State Coulometric Titration Study of Sputtered Cu x  S  Layers by Vervaet, A., Clemminck, I., Burgelman, M.

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Screen printed and sintered CdTe-CdS solar cells: The CdTe thin film solar cell by CLEMMINCK, I, BURGELMAN, M, CASTELEYN, M, DEPUYDT, B

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Reliability of a focused ion beam repair on digital CMOS circuits by Van Camp, R., Van Doorselaer, K., Clemminck, I.

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Growth studies of CuInSe/sub 2/ using Cu-Se fluxes by Casteleyn, M., Burgelman, M., Depuydt, B., Niemegeers, A., Clemminck, I.

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Structural analysis of dry Cu2S-CdS solar cells by VERVAET, A, VAN WASSENHOVE, D, BURGELMAN, M, CLEMMINCK, I

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Structural analysis of “dry” Cu 2SCdS solar cells by Vervaet, A, Vab Wassenhove, D, Burgelman, M, Clemminck, I

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Interdiffusion of CdS and CdTe in screenprinted and sintered CdS-CdTe solar cells by Clemminck, I., Burgelman, M., Casteleyn, M., de Poorter, J., Vervaet, A.

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