Search Results - Cole, E.I. Jr

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  1. 1
    Thermal Modeling of TIVA Profiles of a Polysilcon-Metal Test Structure

    Thermal Modeling of TIVA Profiles of a Polysilcon-Metal Test Structure by Benson, D.A., Cole, E.I. Jr, Tangyunyong, Paiboon

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  2. 2
    Global fault localization using induced voltage alteration

    Global fault localization using induced voltage alteration by Cole Jr, Edward I

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  3. 3
    Backside localization of open and shorted IC interconnections

    Backside localization of open and shorted IC interconnections by Cole, E.I. Jr, Tangyunyong, P., Barton, D.L.

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    Conference Proceeding
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  4. 4
    Resistive contrast imaging: A new SEM mode for failure analysis

    Resistive contrast imaging: A new SEM mode for failure analysis by Smith, C.A., Bagnell, C.R., Cole, E.I., DiBianca, F.A., Johnson, D.G., Oxford, W.V., Propst, R.H.

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