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Review of Scanners for DC to 20 kHz electrical metrology applications
by
Pacheco-Estrada, AH
,
Hernandez-Marquez, FL
,
Rodríguez-Reséndiz, J
,
Duarte-Galvan, C
,
ContrerasMedina, LM
Published in
Measurement : journal of the International Measurement Confederation
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Measurement : Journal Of The International Measurement Confederation
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