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Bump formation for flip chip and CSP by solder paste printing
by
Kloeser, Joachim
,
Coskina, Paradiso
,
Aschenbrenner, Rolf
,
Reichl, Herbert
Published in
Microelectronics and reliability
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Fab Integrated Packaging (FIP): a new concept for high reliability wafer-level chip size packaging
by
Topper, M.
,
Auersperg, J.
,
Glaw, V.
,
Kaskoun, K.
,
Prack, E.
,
Keser, B.
,
Coskina, P.
,
Jager, D.
,
Fetter, D.
,
Ehrmann, O.
,
Samulewicz, K.
,
Meinherz, C.
,
Fehlberg, S.
,
Karduck, C.
,
Reichl, H.
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Lead free alloys for flip chip bumping
by
Jung, E.
,
Aschenbrenner, R.
,
Kallmayer, C.
,
Coskina, P.
,
Reichl, H.
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Wafer-level chip size package (WL-CSP)
by
Topper, M.
,
Fehlberg, S.
,
Scherpinski, K.
,
Karduck, C.
,
Glaw, V.
,
Heinricht, K.
,
Coskina, P.
,
Ehrmann, O.
,
Reichl, H.
Published in
IEEE transactions on advanced packaging
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Numerical and experimental investigations of large IC flip chip attach
by
Schubert, A.
,
Dudek, R.
,
Leutenbauer, R.
,
Coskina, P.
,
Becker, K.-F.
,
Kloeser, J.
,
Michel, B.
,
Reichl, H.
,
Baldwin, D.
,
Qu, J.
,
Sitaraman, S.
,
Wong, C.P.
,
Tummala, R.
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Wafer level package using double balls
by
Topper, M.
,
Glaw, V.
,
Coskina, P.
,
Auersperg, J.
,
Samulewicz, K.
,
Lange, M.
,
Karduck, C.
,
Fehlberg, S.
,
Ehrmann, O.
,
Reichl, H.
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Ieee Transactions On Advanced Packaging
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Microelectronics And Reliability
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Microelectronics Reliability
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Engineering
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Engineering, Electrical & Electronic
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Science & Technology
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Assembly
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Chip Scale Packaging
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Lead
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Materials Science, Multidisciplinary
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Testing
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Chip-Groessen-Kapselung
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Copper
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