Search Results - Coudevylle, J.R.

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    Innovative method to study irradiation damage in silicon pixel detectors for HEP: TLM

    Innovative method to study irradiation damage in silicon pixel detectors for HEP: TLM by Saleem-Rashid, T., Lounis, A., Perrossier, J.L., Hohov, D., Coudevylle, J.R., Villebasse, C., Isac, N.

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