XPS group array analysis of a combinatorial Ni-Ti-Co thin film library by Counsell, Jonathan D. P., Al Hasan, Naila M., Walton, Edward, Gao, Tieren, Hou, Huilong, Takeuchi, Ichiro

Get full text

Angular Distribution of Molecules Sputtered by Gas Cluster Ion Beams and Implications for Secondary Neutral Mass Spectrometry by Lorenz, Matthias, Shard, Alexander G, Counsell, Jonathan D. P, Hutton, Simon, Gilmore, Ian S

Get full text

Intensity calibration and sensitivity factors for XPS instruments with monochromatic Ag Lα and Al Kα sources by Shard, Alexander G., Counsell, Jonathan D.P., Cant, David J. H., Smith, Emily F., Navabpour, Parnia, Zhang, Xiaoling, Blomfield, Christopher J.

Get full text

XPS analysis of group IVA elements using monochromatic Ag Lα x rays by Gerrard, Nikki L., Coultas, Sarah J., Counsell, Jonathan D. P.

Get full text

First row transition metals Fe, Co, Ni, Cu, and Zn analyzed by XPS using monochromatic Ag Lα x rays by Coultas, Sarah J., Counsell, Jonathan D. P., Gerrard, Nikki

Get full text

Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study by Shard, Alexander G, Havelund, Rasmus, Spencer, Steve J, Gilmore, Ian S, Alexander, Morgan R, Angerer, Tina B, Aoyagi, Satoka, Barnes, Jean-Paul, Benayad, Anass, Bernasik, Andrzej, Ceccone, Giacomo, Counsell, Jonathan D. P, Deeks, Christopher, Fletcher, John S, Graham, Daniel J, Heuser, Christian, Lee, Tae Geol, Marie, Camille, Marzec, Mateusz M, Mishra, Gautam, Rading, Derk, Renault, Olivier, Scurr, David J, Shon, Hyun Kyong, Spampinato, Valentina, Tian, Hua, Wang, Fuyi, Winograd, Nicholas, Wu, Kui, Wucher, Andreas, Zhou, Yufan, Zhu, Zihua

Get full text

Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylen... by Reed, Benjamen P., Cant, David J. H., Spencer, Steve J., Carmona-Carmona, Abraham Jorge, Bushell, Adam, Herrera-Gómez, Alberto, Kurokawa, Akira, Thissen, Andreas, Thomas, Andrew G., Britton, Andrew J., Bernasik, Andrzej, Fuchs, Anne, Baddorf, Arthur P., Bock, Bernd, Theilacker, Bill, Cheng, Bin, Castner, David G., Morgan, David J., Valley, David, Willneff, Elizabeth A., Smith, Emily F., Nolot, Emmanuel, Xie, Fangyan, Zorn, Gilad, Smith, Graham C., Yasufuku, Hideyuki, Fenton, Jeffery L., Chen, Jian, Counsell, Jonathan D. P., Radnik, Jörg, Gaskell, Karen J., Artyushkova, Kateryna, Yang, Li, Zhang, Lulu, Eguchi, Makiho, Walker, Marc, Hajdyła, Mariusz, Marzec, Mateusz M., Linford, Matthew R., Kubota, Naoyoshi, Cortazar-Martínez, Orlando, Dietrich, Paul, Satoh, Riki, Schroeder, Sven L. M., Avval, Tahereh G., Nagatomi, Takaharu, Fernandez, Vincent, Lake, Wayne, Azuma, Yasushi, Yoshikawa, Yusuke, Shard, Alexander G.

Get full text

Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS by Belsey, Natalie A, Cant, David J. H, Minelli, Caterina, Araujo, Joyce R, Bock, Bernd, Brüner, Philipp, Castner, David G, Ceccone, Giacomo, Counsell, Jonathan D. P, Dietrich, Paul M, Engelhard, Mark H, Fearn, Sarah, Galhardo, Carlos E, Kalbe, Henryk, Kim, Jeong Won, Lartundo-Rojas, Luis, Luftman, Henry S, Nunney, Tim S, Pseiner, Johannes, Smith, Emily F, Spampinato, Valentina, Sturm, Jacobus M, Thomas, Andrew G, Treacy, Jon P.W, Veith, Lothar, Wagstaffe, Michael, Wang, Hai, Wang, Meiling, Wang, Yung-Chen, Werner, Wolfgang, Yang, Li, Shard, Alexander G

Get full text

Gold, silver, and copper reference spectra for XPS instruments with monochromatic Ag Lα sources by Counsell, Jonathan D. P., Shard, Alex G., Cant, David J., Blomfield, Christopher J., Navabpour, Parnia, Zhang, Xiaoling

Get full text

Sample rotation improves gas cluster sputter depth profiling of polymers by Smith, Emily F., Counsell, Jonathan D. P., Bailey, James, Sharp, James S., Alexander, Morgan R., Shard, Alexander G., Scurr, David J.

Get full text