The BaBar RadFET monitoring board by Camanzi, B., Crawley, H.B., Holmes-Siedle, A., McKay, R.L., McKemey, A., Meyer, W.T., Rosenberg, E.I., Stelzer, J., Tinslay, J.

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CANbus and microcontroller use in the BaBar detector at SLAC by Anthony, P.L., Crawley, H.B., Fischer, P.-A., McKay, R.L., Meyer, W.T.

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A measurement of p̄p and pp elastic scattering at ISR energies by Breakstone, A., Campanini, R., Crawley, H.B., Dallavalle, G.M., Deninno, M.M., Doroba, K., Drijard, D., Fabbri, F., Firestone, A., Fischer, H.G., Frehse, H., Geist, W., Giacomelli, G., Gokieli, R., Gorbics, M., Hanke, P., Heiden, M., Herr, W., Innocenti, P.G., Kluge, E.E., Lamsa, J.W., Lohse, T., Meyer, W.T., Mornacchi, G., Nakada, T., Panter, M., Putzer, A., Rauschnabel, K., Rensch, B., Rimondi, F., Sosnowski, R., Szczekowski, M., Ullaland, O., Wegener, D., Wunsch, M.

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The BaBar RadFET monitoring board by Camanzi, B., Crawley, H.B., Holmes-Siedle, A., McKay, R.L., McKemey, A., Meyer, W.T., Rosenberg, E.I., Stelzer, J., Tinslay, J.

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Charged multiplicity distribution in pp interactions at CERN ISR energies by Breakstone, A., Campanini, R., Crawley, H. B., Dallavalle, G. M., Deninno, M. M., Doroba, K., Drijard, D., Fabbri, F., Faessler, M. A., Firestone, A., Fischer, H. G., Frehse, H., Geist, W., Giacomelli, G., Gokieli, R., Gorbics, M., Gruhn, C., Hanke, P., Heiden, M., Herr, W., Innocenti, P. G., Kluge, E. E., Lamsa, J. W., Lohse, T., Meyer, W. T., Mornacchi, G., Nakada, T., Panter, M., Putzer, A., Rauschnabel, K., Rensch, B., Rimondi, F., Sosnowski, R., Stenlund, E., Symons, T. J. M., Szczekowski, M., Szwed, R., Ullaland, O., Wegener, D., Wunsch, M.

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Recent results from tests of fast analog-to-digital converters by Crawley, H.B., McKay, R., Meyer, W.T., Rosenberg, E.I., Thomas, W.D.

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Testing ADC's at sample rates from 20 to 120 MSPS by Crawley, H.B., McKay, R., Meyer, W.T., Rosenberg, E.I., Thomas, W.D.

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Results of radiation hardness tests and performance tests of the HS9008RH flash ADC by Nutter, S., Tarle, G., Crawley, H.B., McKay, R., Meyer, W.T., Rosenberg, E.I., Thomas, W.D.

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Performance of flash ADCs in the 100 MHz range. II. Results from 8 bit devices by Crawley, H.B., McKay, R., Meyer, W.T., Rosenberg, E.I., Thomas, W.D.

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Performance of flash ADCs in the 100 MHz range. 1; Test bench and preliminary results by Crawley, H.B., McKay, R., Meyer, W.T., Rosenberg, E.I., Thomas, W.D.

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Performance of flash acds in the 100 MHz range; Results from 8 bit devices by Crawley, H.B., McKay, R., Meyer, W.T., Rosenberg, E.I., Thomas, W.D.

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Performance of flash ADCs in the 100 MHz range. I. Test bench and preliminary results by Crawley, H.B., McKay, R., Meyer, W.T., Rosenberg, E.I., Thomas, W.D.

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ARTEMIS: a VMS based Fastbus module testing and evaluation system by Gorbics, M.S., Crawley, H.B., McKay, R., Meyer, W.T., Rosenberg, E.I., Skeens, J.D.

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Multiplicity dependence of transverse momentum spectra at ISR energies by Breakstone, A., Campanini, R., Crawley, H.B., Dallavalle, G.M., Deninno, M.M., Doroba, K., Drijard, D., Fabbri, F., Firestone, A., Fischer, H.G., Frehse, H., Geist, W., Giacomelli, G., Gokieli, R., Gorbics, M., Hanke, P., Heiden, M., Herr, W., Innocenti, P.G., Kluge, E.E., Lamsa, J.W., Lohse, T., Meyer, W.T., Mornacchi, G., Nakada, T., Panter, M., Putzer, A., Rauschnabel, K., Rimondi, F., Sosnowski, R., Szczekowski, M., Ullaland, O., Wegener, D.

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Multiplicity dependence of transverse momentum spectra in pp,p̄p, dd and αα collisions at ISR energies by Breakstone, A., Campanini, R., Claesson, G., Crawley, H.B., Cuffiani, M., Dallavalle, G.M., Deninno, M.M., Doroba, K., Drijard, D., Fabbri, F., Firestone, A., Faessler, M.A., Fischer, H.G., Floege, H., Fung, S.Y., Frehse, H., Garpman, S., Geist, W., Gesswein, L., Giacomelli, G., Gokieli, R., Gorbics, M., Gorski, M., Gruhn, C.R., Hanke, P., Heiden, M., Herr, W., Isenhower, D., Ketel, T.J., Kluge, E.E., Lamsa, J.W., Lohse, T., Lund, I., Mankel, R., Meyer, W.T., Nakada, T., Otterlund, I., Panter, M., Pugh, H., Putzer, A., Rauschnabel, K., Rensch, B., Rimondi, F., Schmelling, M., Schroeder, L., Siroli, G.P., Sosnowski, R., Stenlund, E., Symons, T.J.M., Szczekowski, M., Szwed, R., Ullaland, O., Walczak, R., Wegener, D., Wunsch, M.

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A 15 MHz 32-channel flash ADC FASTBUS board for use at LEP by Crawley, H.B., Gorbics, M.S., Holland, G.E., Homer, J.F., McKay, R., Meyer, W.T., Rosenberg, E.I., Thomas, W.D.

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Using IEEE standard 1057 for testing analog-to-digital converters by Crawley, H.B., McKay, R., Meyer, W.T., Rosenberg, E.I., Thomas, W.D.

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Testing fast ADC's at sample rates between 20 and 140 MSPS by Crawley, H.B., McKay, R., Meyer, W.T., Rosenberg, E.I., Thomas, W.D.

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Performance of flash ADCs in the 100 MHz range. II. Results from 8 bit devices by Crawley, H.B., McKay, R., Meyer, W.T., Rosenberg, E.I., Thomas, W.D.

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Performance Of Flash ADCs In The 100 MHz Range by Crawley, H.B., McKay, R., Meyer, W.T., Rosenberg, E.J., Thomas, W.D.

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