Search Results - Cricchi, J. R.

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  1. 1
    Compensation of Radiation Effects by Charge Transport in Metal-Nitride-Oxide-Semiconductor Structures

    Compensation of Radiation Effects by Charge Transport in Metal-Nitride-Oxide-Semiconductor Structures by Cricchi, J. R., Barbe, D. F.

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  2. 2
    Characterization of thin-oxide MNOS memory transistors

    Characterization of thin-oxide MNOS memory transistors by White, M.H., Cricchi, J.R.

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  3. 3
    Steady-state electron and hole space charge distribution in LPCVD silicon nitride films

    Steady-state electron and hole space charge distribution in LPCVD silicon nitride films by Hampton, F. L., Cricchi, J. R.

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  4. 4
    C-MOS/SOS LSI input/Output protection networks

    C-MOS/SOS LSI input/Output protection networks by Ahlport, B.T., Cricchi, J.R., Barth, D.A.

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  5. 5
    Electronic Recovery from Radiation Effects in CMNOS Structures

    Electronic Recovery from Radiation Effects in CMNOS Structures by Cricchi, J. R., Barbe, D. F.

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  6. 6
    Complementary MOS transistors

    Complementary MOS transistors by White, M.H., Cricchi, J.R.

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  7. 7
    MNOS/SOS Radiation Hardness Performance and Reliability Study

    MNOS/SOS Radiation Hardness Performance and Reliability Study by Hampton,F L, Cricchi,J R

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  8. 8
    Hardened MNOS/SOS Electrically Reprogrammable Nonvolatile Memory

    Hardened MNOS/SOS Electrically Reprogrammable Nonvolatile Memory by Cricchi, J. R., Fitzpatrick, M. D., Blaha, F. C., Ahlport, B. T.

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  9. 9
    Radiation Hardened CMNOS/SOS Mask Programmable Rom and General Processor Unit

    Radiation Hardened CMNOS/SOS Mask Programmable Rom and General Processor Unit by Cricchi, J. R., Barth, D. A., Oehler, H. G., Lyman, R. C., Shipley, J. M., Ahlport, B.

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  10. 10
    Molecularized FM Telemetry Encoder

    Molecularized FM Telemetry Encoder by Cricchi, J., Rachal, F., List, W.

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