Search Results - Cricchi, J.R.

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  1. 1
    Characterization of thin-oxide MNOS memory transistors

    Characterization of thin-oxide MNOS memory transistors by White, M.H., Cricchi, J.R.

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  2. 2
    Foreword SOS special issue-Nonvolatile memory technology

    Foreword SOS special issue-Nonvolatile memory technology by Cricchi, J.R., Wegener, H.A.R.

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  3. 3
    Editorial

    Editorial by Woods, M.H., Cricchi, J.R.

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  4. 4
    Editorial

    Editorial by Woods, M.H., Cricchi, J.R.

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  5. 5
    Compensation of Radiation Effects by Charge Transport in Metal-Nitride-Oxide-Semiconductor Structures

    Compensation of Radiation Effects by Charge Transport in Metal-Nitride-Oxide-Semiconductor Structures by Cricchi, J. R., Barbe, D. F.

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  6. 6
    C-MOS/SOS LSI input/Output protection networks

    C-MOS/SOS LSI input/Output protection networks by Ahlport, B.T., Cricchi, J.R., Barth, D.A.

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  7. 7
    Electronic Recovery from Radiation Effects in CMNOS Structures

    Electronic Recovery from Radiation Effects in CMNOS Structures by Cricchi, J. R., Barbe, D. F.

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  8. 8
    Complementary MOS transistors

    Complementary MOS transistors by White, M.H., Cricchi, J.R.

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