Nonlinear multiscale wavelet diffusion for speckle suppression and edge enhancement in ultrasound images by Yong Yue, Croitoru, M.M., Bidani, A., Zwischenberger, J.B., Clark, J.W.

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Ultrasonic speckle suppression using robust nonlinear wavelet diffusion for LV volume quantification by Yong Yue, Croitoru, M.M., Bidani, A., Zwischenberger, J.B., Clark, J.W.Jr

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A Method to Exploit the Structure of Genetic Ancestry Space to Enhance Case-Control Studies by Colombel, Jean-Frederick, Hugot, Jean-Pierre, Massey, Dunecan, Montgomery, Grant W., Oikonomou, Ioannis, Peeters, Harald, Proctor, Deborah D., Seibold, Frank, Törkvist, Leif, Andrews, Jane M., Bampton, Peter A., Florin, Timothy H., Krishnaprasad, Krupa, Radford-Smith, Graham, Simms, Lisa A., Laukens, Debby, Deslandres, Colette, Duerr, Richard H., Goyette, Philippe, Haritunians, Talin, Lahaie, Raymond G., Ng, Sok Meng, Rioux, John D., Aerts, Jan, Attwood, Anthony, Ball, Stephen G., Brown, Morris J., Burton, John, Byrnes, Jake, Cardin, Niall, Clee, Chris M., Coffey, Alison J., Dominiczak, Anna F., Evans, David M., Farmer, Anne, Ferrier, Nicol, Flynn, Edward, Franklyn, Jayne A., Frayling, Timothy M., Freathy, Rachel M., Gibbs, Polly, Gray, Emma, Howard, Philip, Hughes, Debbie, Hunt, Sarah, Jolley, Jennifer D., Jones, Lisa A., Kirov, George, Maller, Julian, Mansfield, John, McGuffin, Peter, McLay, Kirsten E., Mentzer, Alex, Munroe, Patricia B., Newman, William, Palotie, Aarno, Plagnol, Vincent, Prescott, Natalie J., Quail, Michael A., Reid, David M., Renwick, Anthony, Russell, Ellie, St Clair, David, Scott, Richard, Somaskantharajah, Elilan, Steer, Sophia, Symmons, Deborah P.M., Tobin, Martin D., Wain, Louise V., Walker, Mark, Wallace, Chris, Weedon, Michael N., Wilson, Anthony G., Yau, Chris, Young, Allan H., Brown, Matthew A., Gough, Stephen C.L., Satsangi, Jack, Ouwehand, Willem H., Parkes, Miles, Rahman, Nazneen, Samani, Nilesh J., Kwiatkowski, Dominic P., Donnelly, Peter, Bramon, Elvira, Casas, Juan P., Corvin, Aiden, Jankowski, Janusz, Markus, Hugh S., Palmer, Colin N.A., Plomin, Robert, Viswanathan, Ananth C., Spencer, Chris C.A., Blackburn, Hannah, Gillman, Matthew, McCann, Owen T., Waller, Matthew, Weston, Paul, Whittaker, Pamela, Roeder, Kathryn

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Reliability evaluation and prediction for silicon photodetectors by Weis, E.A., Caldararu, D., Snyder, M.M., Croitoru, N.

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Environmental testing of silicon photodetectors by Weis, E.A., Caldararu, D., Snyder, M.M., Croitoru, N.

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Accelerated lifetime testing of p + n − n + photodiode by Weis, E.A., Caldararu, D., Snyder, M.M., Croitoru, N.

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Electromigration wafer level reliability test and analysis methodology by Weis, E.A., Kinsbron, E., Chanoch, G., Snyder, M.M., Vogel, B., Croitoru, N.

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