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Methodology for electromigration critical threshold design rule evaluation
by
Clement, J.J.
,
Riege, S.P.
,
Cvijetic, R.
,
Thompson, C.V.
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IEEE transactions on computer-aided design of integrated circuits and systems
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Design and Verification Strategies for Ensuring Long-Term Reliability of a 300-MHz Microprocessor
by
Preston, Ronald P.
,
Bowhill, William J.
,
Gronowski, Paul E.
,
Mehta, Shekhar
,
Fischer, Timothy C.
,
Cvijetic, Radenko
,
Lamere, Marc E.
,
Badeau, Roy
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Ieee Transactions On Computer-Aided Design Of Integrated Circuits And Systems
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