Search Results - Czułek, Dariusz

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  1. 1
    Application of active piezoresistive cantilevers in high-eigenmode surface imaging

    Application of active piezoresistive cantilevers in high-eigenmode surface imaging by Pruchnik, Bartosz, Badura, Dominik, Kopczyński, Władysław, Czułek, Dariusz, Rangelow, Ivo W, Korpelainen, Virpi, Sierakowski, Andrzej, Yacoot, Andrew, Gotszalk, Teodor

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    New European Metrology Network for advanced manufacturing

    New European Metrology Network for advanced manufacturing by Przyklenk, Anita, Balsamo, Alessandro, O’Connor, Daniel, Evans, Alexander, Yandayan, Tanfer, Akgöz, Sibel Asli, Flys, Olena, Phillips, Dishi, Zeleny, Vit, Czułek, Dariusz, Meli, Felix, Ragusa, Carlo Stefano, Bosse, Harald

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    Long-term Absolute Wavelength Stability of Acetylene-stabilized Reference Laser at 1533 nm

    Long-term Absolute Wavelength Stability of Acetylene-stabilized Reference Laser at 1533 nm by Kossek, Tomasz, Czulek, Dariusz, Koba, Marcin

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    The CCL-K11 ongoing key comparison. Final report for the year 2015

    The CCL-K11 ongoing key comparison. Final report for the year 2015 by Matus, Michael, Berg, Steven van den, Czulek, Dariusz, Seppä, Jeremias, Robertsson, Lennart

    Published in Metrologia
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