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Conducted EMI susceptibility analysis of a COTS processor as function of thermal cycling and overvoltage stresses
by
Soares, Matheus Fay
,
Vargas, Fabian Luis
,
D'Ornelas Benfica, Juliano
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Microelectronics and reliability
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Artificial Neural Network Accelerator for Classification of In-Field Conducted Noise in Integrated Circuits' DC Power Lines
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Vargas, Fabian
,
Borba, Douglas
,
Benfica, Juliano Dornelas
,
Syed, Rizwan Tariq
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Microelectronics And Reliability
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