Search Results - DHANARAJ, Govindhan

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  1. 1
    Defect analysis in crystals using X-ray topography

    Defect analysis in crystals using X-ray topography by Raghothamachar, Balaji, Dhanaraj, Govindhan, Bai, Jie, Dudley, Michael

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  2. 2
    Epitaxial growth and characterization of silicon carbide films

    Epitaxial growth and characterization of silicon carbide films by Dhanaraj, Govindhan, Dudley, Michael, Chen, Yi, Ragothamachar, Balaji, Wu, Bei, Zhang, Hui

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  3. 3
    Latest developments of large-diameter c-axis sapphire grown by CHES method

    Latest developments of large-diameter c-axis sapphire grown by CHES method by Richard Schwerdtfeger, C., Ullal, Saurabh, Shetty, Raj, Filgate, Joshua, Dhanaraj, Govindhan

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  4. 4
    Chemical Vapor Deposition of Silicon Carbide Epitaxial Films and Their Defect Characterization

    Chemical Vapor Deposition of Silicon Carbide Epitaxial Films and Their Defect Characterization by Dhanaraj, Govindhan, Chen, Yi, Chen, Hui, Cai, Dang, Zhang, Hui, Dudley, Michael

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  5. 5
    Thermodynamic Studies of Carbon in Liquid Silicon Using the Central Atoms Model

    Thermodynamic Studies of Carbon in Liquid Silicon Using the Central Atoms Model by Chen, Yi, Dhanaraj, Govindhan, Dudley, Michael, Zhang, Hui

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  6. 6
    Chemical vapor deposition of silicon carbide epitaxial films and their defect characterization: Group III Nitrides, SiC and ZnO

    Chemical vapor deposition of silicon carbide epitaxial films and their defect characterization: Group III Nitrides, SiC and ZnO by DHANARAJ, Govindhan, YI CHEN, HUI CHEN, DANG CAI, HUI ZHANG, DUDLEY, Michael

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