Device to Circuit Framework for Activity-Dependent NBTI Aging in Digital Circuits by Thirunavukkarasu, A., Amrouch, Hussam, Joe, Jerin, Goel, Nilesh, Parihar, Narendra, Mishra, Subrat, Dabhi, Chetan K., Chauhan, Yogesh S., Henkel, Jorg, Mahapatra, Souvik

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Impact of Self-Heating on Negative-Capacitance FinFET: Device-Circuit Interaction by Prakash, Om, Pahwa, Girish, Dabhi, Chetan K., Chauhan, Yogesh S., Amrouch, Hussam

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Impact of Variability on Processor Performance in Negative Capacitance FinFET Technology by Amrouch, Hussam, Pahwa, Girish, Gaidhane, Amol D., Dabhi, Chetan K., Klemme, Florian, Prakash, Om, Chauhan, Yogesh Singh

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A Simulation Study of NBTI Impact on 14-nm Node FinFET Technology for Logic Applications: Device Degradation to Circuit-Level Interaction by Mishra, Subrat, Amrouch, Hussam, Joe, Jerin, Dabhi, Chetan K., Thakor, Karansingh, Chauhan, Yogesh S., Henkel, Jorg, Mahapatra, Souvik

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Subthermionic negative capacitance ion sensitive field-effect transistor by Bellando, Francesco, Dabhi, Chetan K., Saeidi, Ali, Gastaldi, Carlotta, Chauhan, Yogesh S., Ionescu, Adrian M.

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Transistor Self-Heating: The Rising Challenge for Semiconductor Testing by Prakash, Om, Dabhi, Chetan K., Chauhan, Yogesh S., Amrouch, Hussam

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NBTI-Related Variability Impact on 14-nm Node FinFET SRAM Performance and Static Power: Correlation to Time Zero Fluctuations by Mishra, Subrat, Parihar, Narendra, R., Anandkrishnan, Dabhi, Chetan K., Chauhan, Yogesh S., Mahapatra, Souvik

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