Search Results - Dabrowska-Szata, Maria

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  1. 1
    Characterization of deep-level defects in GaNAs/GaAs heterostructures grown by APMOVPE

    Characterization of deep-level defects in GaNAs/GaAs heterostructures grown by APMOVPE by Gelczuk, Łukasz, Dąbrowska-Szata, Maria, Ściana, Beata, Pucicki, Damian, Radziewicz, Damian, Kopalko, Krzysztof, Tłaczała, Marek

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  2. 2
    Electrically active defects in SiC Schottky barrier diodes

    Electrically active defects in SiC Schottky barrier diodes by Gelczuk, Łukasz, Dąbrowska-szata, Maria, Synowiec, Zdzisław

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  3. 3
    Electro-optical properties of diluted GaAsN on GaAs grown by APMOVPE

    Electro-optical properties of diluted GaAsN on GaAs grown by APMOVPE by Kamyczek, Paulina, Bieganski, Piotr, Placzek-Popko, Ewa, Zielony, Eunika, Gelczuk, Lukasz, Sciana, Beata, Pucicki, Damian, Radziewicz, Damian, Tlaczala, Marek, Kopalko, Krzysztof, Dabrowska-Szata, Maria

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  4. 4
    Critical thickness of epitaxial thin films using Finite Element Method

    Critical thickness of epitaxial thin films using Finite Element Method by Wcislo, T, Dabrowska-Szata, M, Gelczuk, L

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  5. 5
    Dislocation in lattice-mismatched InGaAs/GaAs heterostructures as a factor of optoelectronic device degradation

    Dislocation in lattice-mismatched InGaAs/GaAs heterostructures as a factor of optoelectronic device degradation by Gelczuk, L., Jozwiak, G., Dabrowska-Szata, M., Radziewicz, D.

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  6. 6
    Structural and optical measurements of residual strain and relaxation of lattice mismatched InGaAs/GaAs heterostructures

    Structural and optical measurements of residual strain and relaxation of lattice mismatched InGaAs/GaAs heterostructures by Gelczuk, Lukasz, Dabrowska-Szata, Maria, Serafinczuk, Jaroslaw, Motyka, Marcin, Misiewicz, Jan

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