New Fast Beam Conditions Monitoring (BCM1F) system for CMS by Zagozdzinska, A.A., Bell, A.J., Dabrowski, A.E., Hempel, M., Henschel, H.M., Karacheban, O., Przyborowski, D., Leonard, J.L., Penno, M., Pozniak, K.T., Miraglia, M., Lange, W., Lohmann, W., Ryjov, V., Lokhovitskiy, A., Stickland, D., Walsh, R.

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The CMS Beam Halo Monitor electronics by Tosi, N., Dabrowski, A.E., Fabbri, F., Grassi, T., Hughes, E., Mans, J., Montanari, A., Orfanelli, S., Rusack, R., Torromeo, G., Stickland, D.P., Stifter, K.

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A novel Beam Halo Monitor for the CMS experiment at the LHC by Orfanelli, S., Dabrowski, A.E., Giunta, M., Loos, R., Ambrose, M.J., Mans, J., Rusack, R., Stifter, K., Stickland, D., Fabbri, F., Manna, A., Montanari, A., Tosi, N., Calvelli, V.

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High intensity profile monitor for time resolved spectrometry at the CLIC Test Facility 3 by Olvegård, M., Adli, E., Braun, H.H., Bravin, E., Chritin, N., Corsini, R., Dabrowski, A.E., Döbert, S., Dutriat, C., Egger, D., Lefèvre, T., Mete, O., Skowronski, P.K., Tecker, F.

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Corrigendum to "High intensity profile monitor for time resolved spectrometry at the CLIC Test Facility 3" [Nucl. Instrum. Methods: Phys. Res. A 683 (2012) 29–39] by Olvegård, M., Adli, E., Braun, H.H., Bravin, E., Chritin, N., Corsini, R., Dabrowski, A.E., Dӧbert, S., Dutriat, C., Egger, D., Lefèvre, T., Mete, O., Skowronski, P.K., Tecker, F.

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Architecture of the upgraded BCM1F backend electronics for Beam Conditions and Luminosity measurement by Zagozdzinska, A.A., Dabrowski, A.E., Przyborowski, D., Leonard, J.L., Pozniak, K.T., Miraglia, M., Walsh, R., Lange, W., Lohmann, W., Ryjov, V.

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Silicon strip detectors for two-dimensional soft X-ray imaging at normal incidence by Rato Mendes, P., Abreu, M.C., Baldazzi, G., Bollini, D., Cabal Rodriguez, A.E., Dabrowski, W., Diaz Garcia, A., Gambaccini, M., Giubellino, P., Gombia, M., Grybos, P., Idzik, M., Marzari-Chiesa, A., Montano, L.M., Prino, F., Ramello, L., Rodrigues, S., Sitta, M., Sousa, P., Swientek, K., Taibi, A., Tuffanelli, A., Wheadon, R., Wiacek, P.

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Energy resolution of a silicon detector with the RX64 ASIC designed for X-ray imaging by Bollini, D, Cabal Rodriguez, A.E, Da̧browski, W, Diaz Garcia, A, Gambaccini, M, Giubellino, P, Grybos, P, Idzik, M, Marzari-Chiesa, A, Montano, L.M, Prino, F, Ramello, L, Sitta, M, Swientek, K, Wheadon, R, Wiacek, P

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A silicon strip detector coupled to the RX64 ASIC for X-ray diagnostic imaging by Baldazzi, G, Bollini, D, Cabal Rodriguez, A.E, Da̧browski, W, Diaz Garcia, A, Gambaccini, M, Giubellino, P, Gombia, M, Grybos, P, Idzik, M, Marzari-Chiesa, A, Montano, L.M, Prino, F, Ramello, L, Sitta, M, Swientek, K, Taibi, A, Tuffanelli, A, Wheadon, R, Wiacek, P

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X-ray imaging with a silicon microstrip detector coupled to the RX64 ASIC by Baldazzi, G., Bollini, D., Cabal Rodriguez, A.E., Da̧browski, W., Diaz Garcia, A., Gambaccini, M., Giubellino, P., Gombia, M., Grybos, P., Idzik, M., Marzari-Chiesa, A., Montano Zetina, L.M., Prino, F., Ramello, L., Sitta, M., Swientek, K., Taibi, A., Tuffanelli, A., Wheadon, R., Wiacek, P.

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Low temperature tempering-induced changes in bulk resistivity, temperature coefficient of resistivity and stress in physically vapor-deposited TiN by Ernsberger, Craig, Perry, A.J., Lehman, L.P., Miller, A.E., Pelton, A.R., Dabrowski, B.W.

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