Search Results - DaeYeal Lee
-
1
-
2
-
3
-
4
-
5
-
6
-
7
-
8
-
9
A 64Gb 533Mb/s DDR interface MLC NAND Flash in sub-20nm technology
Conference Proceeding -
10
-
11
-
12
Standard-Cell Scaling Framework with Guaranteed Pin-Accessibility
Conference Proceeding -
13
-
14
-
15
-
16
An Effective Test Pattern Generation for Testing Signal Integrity
Conference Proceeding