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Process optimization tweaking tool (POTT) and its application in controlling oxidation thickness
by
Guldi, R.L.
,
Jenkins, C.D.
,
Oamminga, G.M.
,
Baum, T.A.
,
Foster, T.A.
Published in
IEEE transactions on semiconductor manufacturing
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Characterization of the α-Sn/CdTe(110) interface by angle-resolved X-ray photoemission
by
Lin, Tzer-Shen
,
Partin, William J.
,
Damminga, Gregg M.
,
Parrill, Thomas M.
,
Lee, Won-Jong
,
Chung, Yip-Wah
Published in
Surface science
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