Search Results - Danchenko, Vitaly

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  1. 1
    Activation Energies of Thermal Annealing of Radiation-Induced Damage in N- and P-Channels of CMOS Integrated Circuits

    Activation Energies of Thermal Annealing of Radiation-Induced Damage in N- and P-Channels of CMOS Integrated Circuits by Danchenko, Vitaly, Stassinopoulos, E. G., Fang, P. H., Brashears, Sidney S.

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  2. 2
    Characteristics of Thermal Annealing of Radiation Damage in MOSFET's

    Characteristics of Thermal Annealing of Radiation Damage in MOSFET's by Danchenko, Vitaly, Desai, Upendra D., Brashears, Sidney S.

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  3. 3
    Thermal Annealing of Radiation Damage in CMOS ICs in the Temperature Range -140°C to +375°C

    Thermal Annealing of Radiation Damage in CMOS ICs in the Temperature Range -140°C to +375°C by Danchenko, Vitaly, Fang, P. H., Brashears, Sidney S.

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  4. 4
    Activation Energies of Thermal Annealing of Radiation-Induced Damage in n- and p-channels of CMOS Integrated Circuits, Part II

    Activation Energies of Thermal Annealing of Radiation-Induced Damage in n- and p-channels of CMOS Integrated Circuits, Part II by Danchenko, Vitaly, Fang, P. H., Brashears, Sidney S.

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  5. 5
    Electron Trapping in Rad-Hard RCA IC's Irradiated with Electrons and Gamma Rays

    Electron Trapping in Rad-Hard RCA IC's Irradiated with Electrons and Gamma Rays by Danchenko, Vitaly, Brashears, Sidney S., Fang, P. H.

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  6. 6
    Delayed Darkening of Radiation-Exposed Radiochromic Dye Dosimeters

    Delayed Darkening of Radiation-Exposed Radiochromic Dye Dosimeters by Danchenko, Vitaly, Griffin, George F., Brashears, Sidney S.

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  7. 7
    Investigation of Radiation Damage in Mosfets Using Bias-Temperature Treatments

    Investigation of Radiation Damage in Mosfets Using Bias-Temperature Treatments by Danchenko, Vitaly, Brashears, Sidney S.

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  8. 8
    Chlorine‐Neon Geiger‐Müller Counters with Energy‐Independent Gamma‐Ray Efficiency

    Chlorine‐Neon Geiger‐Müller Counters with Energy‐Independent Gamma‐Ray Efficiency by Danchenko, Vitaly, Mitrofanov, Nicolas

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  9. 9
    Effects of electric fields on annealing of radiation damage in MOSFET's

    Effects of electric fields on annealing of radiation damage in MOSFET's by Danchenko, V., Desai, U.D., Killiany, J.M., Brashears, S.S.

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  10. 10
    Pareto-effective system of indicators for strategic development as the basis for the functioning of the digital industry environment in the region

    Pareto-effective system of indicators for strategic development as the basis for the functioning of the digital industry environment in the region by Melnikov, Vitaly, Shtapova, Irina, Danchenko, Nadezhda, Abelyan, Akop

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