Search Results - Danzebrink, H.U.

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    Dimensional Measurements for Micro- and Nanotechnology

    Dimensional Measurements for Micro- and Nanotechnology by Danzebrink, H.U., Pohlenz, F., Koenders, L., Dai, Gao Liang

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    Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining

    Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining by Lehrer, C., Frey, L., Petersen, S., Sulzbach, Th, Ohlsson, O., Dziomba, Th, Danzebrink, H.U., Ryssel, H.

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    Ellipsometric measurements on single-crystal silicon spheres [for Avogadro's constant determination]

    Ellipsometric measurements on single-crystal silicon spheres [for Avogadro's constant determination] by Danzebrink, H.U., Wolff, H., Becker, P., Koenders, L.

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