Search Results - Dat, Ngyuen Thanh

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    Comparing Variation-tolerance and SEU/TID-Resilience of Three SRAM Cells in 28nm FD-SOI Technology: 6T, Quatro, and we-Quatro

    Comparing Variation-tolerance and SEU/TID-Resilience of Three SRAM Cells in 28nm FD-SOI Technology: 6T, Quatro, and we-Quatro by Trang Dang, Le Dinh, Dinh Linh, Trinh, Dat, Ngyuen Thanh, Min, Changhong, Kim, Jinsang, Chang, Ik-Joon, Han, Jin-woo

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