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Wirebonding at higher ultrasonic frequencies: reliability and process implications
by
Charles, H.K
,
Mach, K.J
,
Lehtonen, S.J
,
Francomacaro, A.S
,
DeBoy, J.S
,
Edwards, R.L
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Microelectronics and reliability
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High-frequency wirebonding: process and reliability implications
by
Charles, H.K.
,
Mach, K.J.
,
Lehtonen, S.J.
,
Francomacaro, A.S.
,
DeBoy, J.S.
,
Edwards, R.L.
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