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Search Results - Deaton, Terrence F.
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Neutron Induced Single Event Testing of Commercial Ferroelectric Memory Device (FRAM)
by
Deaton, Terrence F.
,
Tostanoski, Michael J.
,
Peters, Michael K.
,
Hartojo, Kristianto
,
Lachiewicz, Gerard
,
Fullem, Travis Z.
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Neutron Induced Single Event Upset (SEU) Testing of Commercial Memory Devices with Embedded Error Correction Codes (ECC)
by
Bird, John M.
,
Peters, Michael K.
,
Fullem, Travis Z.
,
Tostanoski, Michael J.
,
Deaton, Terrence F.
,
Hartojo, Kristianto
,
Strayer, Roy E.
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Neutron Induced Single Event Upset (SEU) Testing of Static Random Access Memory (SRAM) Devices
by
Tostanoski, Michael J.
,
Deaton, Terrence F.
,
Strayer, Roy E.
,
Goldflam, Rudolf
,
Fullem, Travis Z.
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Laser Damage in Materials
by
Saito, Theodore T
,
Deaton, Terrence F
Published in
Optical Engineering
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Absorption coefficient measurements of nitrous oxide and methane at DF laser wavelengths
by
Deaton, Terrence F.
,
Depatie, David A.
,
Walker, Thomas W.
Published in
Applied physics letters
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Feasibility Of Using Fiber Optics For Monitoring Groundwater Contaminants
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Hirschfeld, Tomas
,
Deaton, Terrence
,
Milanovich, Fred
,
Klainer, Stanley
Published in
Optical Engineering
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