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Search Results - Delecourt, H.-X.
Search Results - Delecourt, H.-X.
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Life condition monitoring on smart power devices using a sequence of current and charge-based capacitance measurements
by
Zhenqiu Ning
,
de Vylder, E.
,
Vlachakis, B.
,
Delecourt, H.-X.
,
Gillon, R.
,
Van Torre, P.
,
Hegsted, D.
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Analog characterization of dielectric relaxation of MIM capacitor using an improved recovery voltage technique
by
Zhenqiu Ning
,
Casier, H.
,
Gillon, R.
,
Delecourt, H.-X.
,
Tack, D.
,
de Vylder, E.
,
van Torre, P.
,
Hegsted, D.
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Precise analogue characterization of MIM capacitors using an improved charge-based capacitance measurement (CBCM) technique
by
Zhenqiu Ning
,
Delecourt, H.-X.
,
De Schepper, L.
,
Gillon, R.
,
Tack, M.
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Analogue characterization of horizontal bars capacitors for smart power applications
by
Zhenqiu Ning
,
Delecourt, H.-X.
,
De Schepper, L.
,
Tack, D.
,
Desoete, B.
,
Gillon, R.
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A simple and accurate capacitance ratio measurement technique for integrated circuit capacitor arrays
by
Zhenqiu Ning
,
De Schepper, L.
,
Delecourt, H.-X.
,
Gillon, R.
,
Tack, M.
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Engineering
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Engineering, Electrical & Electronic
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Ambient Intelligence
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Capacitance Measurement
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Circuit Testing
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Dielectric Measurements
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Mim Capacitors
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Parasitic Capacitance
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Instruments & Instrumentation
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Linearity
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Mos Capacitors
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Voltage
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Analog Integrated Circuits
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Bars
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Capacitors
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Cmos Technology
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Condition Monitoring
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Ieee Electronic Library (Iel) Conference Proceedings
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