New concept using Passive Infrared (PIR) technology for a contactless detection of breathing movement: a pilot study involving a cohort of 169 adult patients by Hers, V., Corbugy, D., Joslet, I., Hermant, P., Demarteau, J., Delhougne, B., Vandermoten, G., Hermanne, J. P.

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Nouveau concept utilisant la technologie PIR (passif infra red motion) pour la détection sans contact des mouvements respiratoires : une étude pilote sur 150 patients adultes by Hers, V, Corbugy, D, Joslet, I, Hermant, P, Demarteau, J, Delhougne, B, Vandermoten, G, Hermanne, J.-P

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Degradation mapping of IGZO TFTs by Rinaudo, P., Chasin, A., Franco, J., Wu, Z., Rassoul, N., Delhougne, R., Kaczer, B., Wolf, I. De, Kar, G.S.

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Feasibility of InxGa1-xAs High Mobility Channel for 3-D NAND Memory by Capogreco, E., Subirats, A., Lisoni, J. G., Arreghini, A., Kunert, B., Guo, W., Tan, C.-L, Delhougne, R., Van den bosch, G., De Meyer, K., Furnemont, A., Van Houdt, J.

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Feasibility of In x Ga1– x As High Mobility Channel for 3-D NAND Memory by Capogreco, E, Subirats, A, Lisoni, J G, Arreghini, A, Kunert, B, Guo, W, C-L, Tan, Delhougne, R, Van den bosch, G, De Meyer, K, Furnemont, A, J Van Houdt

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Feasibility of In x Ga 1– x As High Mobility Channel for 3-D NAND Memory by Capogreco, E., Subirats, A., Lisoni, J. G., Arreghini, A., Kunert, B., Guo, W., Tan, C.-L., Delhougne, R., Van den bosch, G., De Meyer, K., Furnemont, A., Van Houdt, J.

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Understanding and modelling the PBTI reliability of thin-film IGZO transistors by Chasin, A., Franco, J., Triantopoulos, K., Dekkers, H., Rassoul, N., Belmonte, A., Smets, Q., Subhechha, S., Claes, D., van Setten, M. J., Mitard, J., Delhougne, R., Afanas'ev, V., Kaczer, B., Kar, G. S.

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Athermal germanium migration in strained silicon layers during junction formation with solid-phase epitaxial regrowth by Vandervorst, W., Janssens, T., Brijs, B., Delhougne, R., Loo, R., Caymax, M., Pawlak, B. J., Posselt, Matthias

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Characterizing and Modelling of the BTI Reliability in IGZO-TFT using Light-assisted I-V Spectroscopy by Wu, Z., Chasin, A., Franco, J., Subhechha, S., Dekkers, H., Bhuvaneshwari, Y.V., Belmonte, A., Rassoul, N., van Setten, M.J., Afanas'Ev, V., Delhougne, R., Kaczer, B., Kar, G.S.

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Degradation mapping and impact of device dimension on IGZO TFTs BTI by Rinaudo, P., Chasin, A., Franco, J., Wu, Z., Subhechha, S., Arutchelvan, G., Eneman, G., Ramana, B. Y. V., Rassoul, N., Delhougne, R., Kaczer, B., Wolf, I. De, Kar, G.S.

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