Search Results - Delmas-Bendhia, Sonia

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  1. 1
    Characterization and modeling of parasitic emission in deep submicron CMOS

    Characterization and modeling of parasitic emission in deep submicron CMOS by Vrignon, B., Bendhia, S.D., Lamoureux, E., Sicard, E.

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  2. 2
    The challenge of signal integrity in deep-submicrometer CMOS technology

    The challenge of signal integrity in deep-submicrometer CMOS technology by Caignet, F., Delmas-Bendhia, S., Sicard, E.

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  3. 3
    A new method for measuring signal integrity in CMOS ICs

    A new method for measuring signal integrity in CMOS ICs by Delmas-Bendhia, Sonia, Caignet, Fabrice, Sicard, Etienne

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  4. 4
    The challenge of signal integrity in deep-submicrometer CMOS technology: Interconnections-Addressing the Next Challenge of IC Technology. Part I: Integration and Packaging Trends

    The challenge of signal integrity in deep-submicrometer CMOS technology: Interconnections-Addressing the Next Challenge of IC Technology. Part I: Integration and Packaging Trends by CAIGNET, Fabrice, DELMAS-BENDHIA, Sonia, SICARD, Etienne

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  5. 5
    On-chip sampling in CMOS integrated circuits

    On-chip sampling in CMOS integrated circuits by Delmas-Bendhia, S., Caignet, F., Sicard, E., Roca, M.

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