Impact of place and route strategy on FPGA electromagnetic emission by Lara, Estevan L., Constante, Allan A., Benfica, Juliano, Vargas, Fabian, Boyer, Alexandre, Dhia, Sonia B., Gleinser, Andreas, Winkler, Gunter, Deutschmann, Bernd

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On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations by Dhia, S., Boyer, A., Vrignon, B., Deobarro, M., Dinh, T. V.

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Characterization of the Evolution of IC Emissions After Accelerated Aging by Boyer, A., Ndoye, A.C., Ben Dhia, S., Guillot, L., Vrignon, B.

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Prediction of Long-term Immunity of a Phase-Locked Loop by Boyer, A., Ben Dhia, S., Li, B., Lemoine, C., Vrignon, B.

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IC Immunity Modeling Process Validation Using On-Chip Measurements by Ben Dhia, S., Boyer, A., Vrignon, B., Deobarro, M.

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Modeling the Electromagnetic Emission of a Microcontroller Using a Single Model by Labussiere-Dorgan, C., Bendhia, S., Sicard, E., Junwu Tao, Quaresma, H.J., Lochot, C., Vrignon, B.

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On the measurement of crosstalk in integrated circuits by Caignet, F., Dhia, S.D.-B., Sicard, E.

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Ageing effect on electromagnetic susceptibility of a phase locked loop by Li, B., Boyer, A., Bendhia, S., Lemoine, C.

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Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences by Li, B., Berbel, N., Boyer, A., BenDhia, S., Fernández-García, R.

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Characterization and modeling of parasitic emission in deep submicron CMOS by Vrignon, B., Bendhia, S.D., Lamoureux, E., Sicard, E.

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Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout by Berbel, N., Fernández-García, R., Gil, I., Li, B., Boyer, A., BenDhia, S.

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Coupling study in smart power mixed ICs with a dedicated on-chip sensor by Tomasevic, V., Boyer, A., Bendhia, S., Steinmair, A., Weiss, B., Seebacher, E., Rust, P.

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Near-field scan - State of the art and standardisation by Shepherd, J., Marot, C., Vrignon, B., Ben Dhia, Sonia

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Analysis of emission spectra evolution after accelerated aging of integrated circuits by Ndoye, A.C., Ben Dhia, S., Boyer, A., Guillot, L., Vrignon, B.

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