Search Results - Diehl, Sherra E.

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  1. 1
    Simulation of Worst-Case Total Dose Radiation Effects in CMOS VLSI Circuits

    Simulation of Worst-Case Total Dose Radiation Effects in CMOS VLSI Circuits by Bhuva, Bharat L., Paulos, John J., Diehl, Sherra E.

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  2. 2
    An Efficient Numerical Algorithm for Simulation of MOS Capacitance

    An Efficient Numerical Algorithm for Simulation of MOS Capacitance by Jaeger, R.C., Gaensslen, F.H., Diehl, S.E.

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  3. 3
    Transient Radiation Upset Simulations of CMOS Memory Circuits

    Transient Radiation Upset Simulations of CMOS Memory Circuits by Massengill, Lloyd W., Diehl-Nagle, Sherra E.

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  4. 4
    A New Class of Single Event Soft Errors

    A New Class of Single Event Soft Errors by Diehl-Nagle, Sherra E.

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  5. 5
    An Improved Single Event Resistive-Hardening Technique for CMOS Static RAMS

    An Improved Single Event Resistive-Hardening Technique for CMOS Static RAMS by Johnson, Richard L., Diehl, Sherra E.

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  6. 6
    Simulation Approach for Modeling Single Event Upsets on Advanced CMOS SRAMS

    Simulation Approach for Modeling Single Event Upsets on Advanced CMOS SRAMS by Johnson, Richard L., Diehl-Nagle, Sherra E., Hauser, John R.

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  7. 7
    Degree of hydration and lateral diffusion in phospholipid multibilayers

    Degree of hydration and lateral diffusion in phospholipid multibilayers by McCown, J. Thomas, Evans, Evan, Diehl, Sherra, Wiles, H. Craig

    Published in Biochemistry (Easton)
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