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Search Results - Dohar, Suraj Singh
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A 1.2 V, Highly Reliable RHBD 10T SRAM Cell for Aerospace Application
by
Dohar, Suraj Singh
,
R. K., Siddharth
,
M. H., Vasantha
,
Y. B., Nithin Kumar
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IEEE transactions on electron devices
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A 1.2 V Single Event Multinode Upset Tolerant RHSC 12T Memory Cell in 65-nm CMOS
by
Dohar, Suraj Singh
,
K., Siddharth R.
,
H., Vasantha M.
,
B., Nithin Kumar Y.
Published in
IEEE transactions on electron devices
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A Novel Single Event Upset Tolerant 12T Memory Cell for Aerospace Applications
by
Dohar, Suraj
,
Siddharth, R. K.
,
Vasantha, M. H.
,
Kumar Y. B., Nithin
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