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Asymptotics for a diffusion-perturbed risk model with dependence structures, constant interest force, and a random number of delayed claims
by
Liu, Xijun
,
Gao, Qingwu
,
Dong, Zimai
Published in
Stochastic models
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Precise large deviations of the net loss process in a non-standard two-dimensional risk model
by
Gao, Qingwu
,
Dong, Zimai
,
Liu, Xijun
,
Yan, Junni
Published in
Probability in the engineering and informational sciences
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Optimum Ge Profile Design for High-Response SiGe/Si Heterojunction Phototransistor Applicable in Wide Spectral Range of 400-1000 nm
by
Shen, Xiaoting
,
Xie, Hongyun
,
Han, Dong
,
Ge, Yunpeng
,
Yang, Xiaoxiong
,
Xu, Zimai
,
Na, Weicong
,
Jin, Dongyue
,
Zhang, Wanrong
Published in
IEEE transactions on electron devices
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Ieee Transactions On Electron Devices
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Probability In The Engineering And Informational Sciences
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Stochastic Models
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Asymptotic Properties
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Asymptotics
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Bandwidths
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Delayed Claims
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Dependence Structures
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Diffusion-Perturbed Risk Model
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Engineering, Electrical & Electronic
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Germanium
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Taylor And Francis Science And Technology Collection
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