Search Results - Donnelly, K.P.

  • Showing 1 - 5 results of 5
Refine Results
  1. 1
    Nonlinear dc and ac conductivity in electrically insulating composites

    Nonlinear dc and ac conductivity in electrically insulating composites by Donnelly, K.P., Varlow, B.R.

    Get full text
    Article
    Save to List
    Saved in:
  2. 2
    Non-linear DC and AC conductivity in electrically insulating composites

    Non-linear DC and AC conductivity in electrically insulating composites by Donnelly, K.P., Varlow, B.R.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  3. 3
    The Influence of Different Physical Activity Behaviours on the Gut Microbiota of Older Irish Adults

    The Influence of Different Physical Activity Behaviours on the Gut Microbiota of Older Irish Adults by Zhong, X., Powell, C., Phillips, C. M., Millar, S. R., Carson, B. P., Dowd, K. P., Perry, I. J., Kearney, P. M., Harrington, J. M., O’Toole, P. W., Donnelly, Alan E.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  4. 4
    A multi-institutional analysis of intraoperative radiotherapy for early breast cancer: Does age matter?

    A multi-institutional analysis of intraoperative radiotherapy for early breast cancer: Does age matter? by Abbott, A.M., Valente, S.A., Loftus, L., Tendulkar, R.D., Greif, J.M., Bethke, K.P., Donnelly, E.D., Lottich, C., Ross, D.L., Friedman, N.B., Bedi, C.G., Joh, J.E., Kelemen, P., Hoefer, R.A., Kang, S.K., Ruffer, J., Police, A., Fyles, A., Graves, G.M., Willey, S.C., Tousimis, E.A., Small, W., Lyons, J., Grobmyer, S., Laronga, C.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  5. 5
    TRG-OES measurements of electron temperatures during fluorocarbon plasma etching of SiO/sub 2/ damage test wafers

    TRG-OES measurements of electron temperatures during fluorocarbon plasma etching of SiO/sub 2/ damage test wafers by Schabel, M.J., Donnelly, V.M., Cheung, K.P., Kornblit, A., Layadi, N., Tai, W.W.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:

Search Tools: