On the accuracy of current TCAD hot carrier injection models in nanoscale devices by Zaka, Alban, Rafhay, Quentin, Iellina, Matteo, Palestri, Pierpaolo, Clerc, Raphaël, Rideau, Denis, Garetto, Davide, Dornel, Erwan, Singer, Julien, Pananakakis, Georges, Tavernier, Clément, Jaouen, Hervé

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Characterization and modelling of gate current injection in embedded non-volatile flash memory by Zaka, A., Garetto, D., Rideau, D., Palestri, P., Manceau, J., Dornel, E., Rafhay, Q., Clerc, R., Leblebici, Y., Tavernier, C., Jaouen, H.

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Characterization and Physical Modeling of Endurance in Embedded Non-Volatile Memory Technology by Garetto, D, Zaka, A, Manceau, J-P, Rideau, D, Dornel, E, Clark, W F, Schmid, A, Jaouen, H, Leblebici, Y

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Small signal analysis of electrically-stressed oxides with Poisson-Schroedinger based multiphonon capture model by Garetto, D, Randriamihaja, Y M, Rideau, D, Dornel, E, William, F C, Schmid, A, Huard, V, Jaouen, H, Leblebici, Y

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Programming efficiency and drain disturb trade-off in embedded Non Volatile Memories by Zaka, A, Palestri, P, Rideau, D, Iellina, M, Dornel, E, Rafhay, Q, Tavernier, C, Jaouen, H

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