Search Results - Doyen, Célestin

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    Electrical Characterization of the Backside Interface on BSI Global Shutter Pixels with Tungsten-Shield Test Structures on CDTI Process

    Electrical Characterization of the Backside Interface on BSI Global Shutter Pixels with Tungsten-Shield Test Structures on CDTI Process by Doyen, Célestin, Ricq, Stéphane, Magnan, Pierre, Marcelot, Olivier, Barlas, Marios, Place, Sébastien

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    Investigating Reliability of NIR QD-based Photodiodes Under Bias and Light Stres

    Investigating Reliability of NIR QD-based Photodiodes Under Bias and Light Stres by Hammad, Ismail, Coignus, Jean, Ney, David, Doyen, Celestin, Perrin, Sebastien, Ricq, Stephane, Cacho, Florian, Wantz, Guillaume, Federspiel, Xavier, Roy, David, Josse, Emmanuel

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