Search Results - Drogue, Nathalie

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  1. 1
    TXRF capability of metallic contamination analysis on rough silicon wafers

    TXRF capability of metallic contamination analysis on rough silicon wafers by Yim, Viviane, Mukhtarov, Anna, Drogue, Nathalie, Autillo, Delphine, Lardin, Thierry, Zussy, Marc, Dechamp, Jérôme, Truffier-Boutry, Delphine

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  2. 2
    Substitutional Carbon Incorporation in SiGeC/Si Heterostructures: Influence of Silicon Precursors

    Substitutional Carbon Incorporation in SiGeC/Si Heterostructures: Influence of Silicon Precursors by Vives, Jérémy, Deprat, Fabien, Dutartre, Didier, Lespiaux, Justine, Duru, Romain, Bicer, Mehmet, Drogue, Nathalie, Juhel, Marc, Chaussende, Didier

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    An analysis of trace metal contaminants on silicon surface by VPD-ToF-SIMS and VPD-SIMS: towards 1E6-1E7at/cm2 detection limits

    An analysis of trace metal contaminants on silicon surface by VPD-ToF-SIMS and VPD-SIMS: towards 1E6-1E7at/cm2 detection limits by Juhel, Marc, Trouiller, Chantal, Guiheux, Denis, Arsac, Cyril, Drogue, Nathalie, Couvrat, Stephanie, Grosjean, Catherine

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    An analyis of trace metal contaminants on silicon surface by VPD‐ToF‐SIMS and VPD‐SIMS: towards 1E6‐1E7at/cm 2 detection limits

    An analyis of trace metal contaminants on silicon surface by VPD‐ToF‐SIMS and VPD‐SIMS: towards 1E6‐1E7at/cm 2 detection limits by Juhel, Marc, Trouiller, Chantal, Guiheux, Denis, Arsac, Cyril, Drogue, Nathalie, Couvrat, Stephanie, Grosjean, Catherine

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    An analyis of trace metal contaminants on silicon surface by VPD-ToF-SIMS and VPD-SIMS: towards 1E6-1E7at/cm2 detection limits

    An analyis of trace metal contaminants on silicon surface by VPD-ToF-SIMS and VPD-SIMS: towards 1E6-1E7at/cm2 detection limits by Juhel, Marc, Trouiller, Chantal, Guiheux, Denis, Arsac, Cyril, Drogue, Nathalie, Couvrat, Stephanie, Grosjean, Catherine

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    An analyis of trace metal contaminants on silicon surface by VPD-ToF-SIMS and VPD-SIMS: towards 1 E6-1 E7at/cm2 detection limits

    An analyis of trace metal contaminants on silicon surface by VPD-ToF-SIMS and VPD-SIMS: towards 1 E6-1 E7at/cm2 detection limits by JUHEL, Marc, TROUILLER, Chantal, GUIHEUX, Denis, ARSAC, Cyril, DROGUE, Nathalie, COUVRAT, Stephanie, GROSJEAN, Catherine

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  7. 7
    Plant root transcriptome profiling reveals a strain-dependent response during Azospirillum-rice cooperation

    Plant root transcriptome profiling reveals a strain-dependent response during Azospirillum-rice cooperation by Drogue, Benoît, Sanguin, Hervé, Chamam, Amel, Mozar, Michael, Llauro, Christel, Panaud, Olivier, Prigent-Combaret, Claire, Picault, Nathalie, Wisniewski-Dyé, Florence

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