Search Results - Drozdov, Yurii Nikolaevich

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  1. 1
    How to distinguish between opposite faces of an a‐plane sapphire wafer

    How to distinguish between opposite faces of an a‐plane sapphire wafer by Yunin, Pavel Andreevich, Drozdov, Yurii Nikolaevich

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  2. 2
    A new approach to express ToF SIMS depth profiling

    A new approach to express ToF SIMS depth profiling by Yunin, Pavel Andreevich, Drozdov, Yurii Nikolaevich, Drozdov, Mikhail Nikolaevich

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  3. 3
    Recovery of SIMS depth profiles with account for nonstationary effects

    Recovery of SIMS depth profiles with account for nonstationary effects by Yunin, Pavel Andreevich, Drozdov, Yurii Nikolaevich, Drozdov, Mikhail Nikolaevich, Yurasov, Dmitry Vladimirovich

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  4. 4
    Experimental shift allowance in the deconvolution of SIMS depth profiles

    Experimental shift allowance in the deconvolution of SIMS depth profiles by Yunin, Pavel Andreevich, Drozdov, Yurii Nikolaevich, Drozdov, Mikhail Nikolaevich

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  5. 5
    Experimental shift allowance in the deconvolution of SIMS depth profiles

    Experimental shift allowance in the deconvolution of SIMS depth profiles by YUNIN, Pavel Andrevich, DROZDOV, Yurii Nikolaevich, DROZDOV, Mikhail Nikolaevich

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