Search Results - Dycus, J.H.

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  1. 1
    A reliable approach to prepare brittle semiconducting materials for cross‐sectional transmission electron microscopy

    A reliable approach to prepare brittle semiconducting materials for cross‐sectional transmission electron microscopy by DYCUS, J.H., LEBEAU, J.M.

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  2. 2
    Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy

    Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy by Chen, Z., Weyland, M., Sang, X., Xu, W., Dycus, J.H., LeBeau, J.M., D'Alfonso, A.J., Allen, L.J., Findlay, S.D.

    Published in Ultramicroscopy
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  3. 3
    Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopy

    Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopy by Dycus, J.H., Xu, W., Sang, X., D'Alfonso, A.J., Chen, Z., Weyland, M., Allen, L.J., Findlay, S.D., LeBeau, J.M.

    Published in Ultramicroscopy
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  4. 4
    Numerical modeling of specimen geometry for quantitative energy dispersive X-ray spectroscopy

    Numerical modeling of specimen geometry for quantitative energy dispersive X-ray spectroscopy by Xu, W., Dycus, J.H., LeBeau, J.M.

    Published in Ultramicroscopy
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  5. 5
    A numerical model for multiple detector energy dispersive X-ray spectroscopy in the transmission electron microscope

    A numerical model for multiple detector energy dispersive X-ray spectroscopy in the transmission electron microscope by Xu, W., Dycus, J.H., Sang, X., LeBeau, J.M.

    Published in Ultramicroscopy
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  6. 6
    Resolving Ambiguities at the Bi2Te3/GaAs Interface with Atomic Resolution EDS

    Resolving Ambiguities at the Bi2Te3/GaAs Interface with Atomic Resolution EDS by Dycus, J.H.

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  7. 7
    Absolute-Scale Comparison with Simulation for Quantitative Energy-Dispersive X-Ray Spectroscopy in Atomic-Resolution Scanning Transmission Electron Microscopy

    Absolute-Scale Comparison with Simulation for Quantitative Energy-Dispersive X-Ray Spectroscopy in Atomic-Resolution Scanning Transmission Electron Microscopy by Findlay, S.D., Chen, Z., Weyland, M., Sang, X., Xu, W., Dycus, J.H., LeBeau, J.M., Allen, L.J.

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