Search Results - Dziomba, Th

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  1. 1
    Nano‐slit probes for near‐field optical microscopy fabricated by focused ion beams

    Nano‐slit probes for near‐field optical microscopy fabricated by focused ion beams by Danzebrink, H. U., Dziomba, TH, Sulzbach, T., Ohlsson, O., Lehrer, C., Frey, L.

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  2. 2
    Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining

    Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining by Lehrer, C., Frey, L., Petersen, S., Sulzbach, Th, Ohlsson, O., Dziomba, Th, Danzebrink, H.U., Ryssel, H.

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  3. 3
    Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM)

    Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM) by Dziomba, Th, Sulzbach, Th, Ohlsson, O., Lehrer, Ch, Frey, L., Danzebrink, H. U.

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  4. 4
    Graphene p-n junction arrays as quantum-Hall resistance standards

    Graphene p-n junction arrays as quantum-Hall resistance standards by Woszczyna, M., Friedemann, M., Dziomba, T., Weimann, Th, Ahlers, F. J.

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  5. 5
    Versatile sputtering technology for Al2O3 gate insulators on graphene

    Versatile sputtering technology for Al2O3 gate insulators on graphene by Friedemann, M, Woszczyna, M, Müller, A, Wundrack, S, Dziomba, T, Weimann, Th, Seyller, Th, Ahlers, F

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