Search Results - ELLERKMANN, U

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  1. 1
    Interface-related thickness dependence of the tunability in BaSrTiO3 thin films

    Interface-related thickness dependence of the tunability in BaSrTiO3 thin films by Ellerkmann, U., Liedtke, R., Boettger, U., Waser, R.

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  2. 2
    Reduction of film thickness for chemical solution deposited PbZr0.3Ti0.7O3 thin films revealing no size effects and maintaining high remanent polarization and low coercive field

    Reduction of film thickness for chemical solution deposited PbZr0.3Ti0.7O3 thin films revealing no size effects and maintaining high remanent polarization and low coercive field by ELLERKMANN, U, SCHNELLER, T, NAUENHEIM, C, BÖTTGER, U, WASER, R

    Published in Thin solid films
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  3. 3
    Effects of ferroelectric fatigue on the piezoelectric properties ( d 33 ) of tetragonal lead zirconate titanate thin films

    Effects of ferroelectric fatigue on the piezoelectric properties ( d 33 ) of tetragonal lead zirconate titanate thin films by Gerber, P., Kügeler, C., Ellerkmann, U., Schorn, P., Böttger, U., Waser, R.

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  4. 4
    Influence of the Film-Electrode Interface in Thin-Film Capacitors

    Influence of the Film-Electrode Interface in Thin-Film Capacitors by Ellerkmann, U., Liedtke, R., Waser, R.

    Published in Ferroelectrics
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  5. 5
    Non-Linear Imprint Behavior of PZT Thin Films

    Non-Linear Imprint Behavior of PZT Thin Films by Schorn, P., Ellerkmann, U., Bolten, D., Boettger, U., Waser, R.

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  6. 6
    From Submicron Stand-Alone Capacitor Testing to Fast Pulse Switching Experiments and Testing of Fully Integrated Ferroelectric 1T-1C Test Structures

    From Submicron Stand-Alone Capacitor Testing to Fast Pulse Switching Experiments and Testing of Fully Integrated Ferroelectric 1T-1C Test Structures by Schmitz, T., Tiedke, S., Ellerkmann, U.

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  7. 7
    Influence of Asymmetric Oxide Electrode Structures on the Interface Capacity and the Failure Mechanisms in PZT Thin Films

    Influence of Asymmetric Oxide Electrode Structures on the Interface Capacity and the Failure Mechanisms in PZT Thin Films by Ellerkmann, U., Schorn, P., Bolten, D., Boettger, U., Waser, R., Bruchhaus, R., Yamakawa, K.

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  8. 8
    Reduction of film thickness for chemical solution deposited PbZr 0.3Ti 0.7O 3 thin films revealing no size effects and maintaining high remanent polarization and low coercive field

    Reduction of film thickness for chemical solution deposited PbZr 0.3Ti 0.7O 3 thin films revealing no size effects and maintaining high remanent polarization and low coercive field by Ellerkmann, U., Schneller, T., Nauenheim, C., Böttger, U., Waser, R.

    Published in Thin solid films
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  9. 9
    Effects of Thermal Annealing on the Structure of Ferroelectric Thin Films

    Effects of Thermal Annealing on the Structure of Ferroelectric Thin Films by Cao, Jiang-Li, Solbach, Axel, Klemradt, Uwe, Weirich, Thomas, Mayer, Joachim, Böttger, Ulrich, Ellerkmann, Ulrich, Schorn, Peter J., Gerber, Peter, Waser, Rainer

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  10. 10
    Scaling Effect on the Dielectric Constant in Ba(TixZr1?x)O3 Thin Films

    Scaling Effect on the Dielectric Constant in Ba(TixZr1?x)O3 Thin Films by Hofer, C, Ellerkmann, U, Halder, S, Meyer, R, Waser, R

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  11. 11
    Neurologisches Ergebnis und allgemeiner Gesundheitszustand bei Langzeitüberleben nach außerklinischer kardiopulmonaler Reanimation

    Neurologisches Ergebnis und allgemeiner Gesundheitszustand bei Langzeitüberleben nach außerklinischer kardiopulmonaler Reanimation by Poth, J. M., Buschmann, C. M., Kappler, J., Heister, U., Ehrentraut, S. F., Muenster, S., Diepenseifen, C. J., Ellerkmann, R., Schewe, J.-C.

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  12. 12
    Erratum zu: Neurologisches Ergebnis und allgemeiner Gesundheitszustand bei Langzeitüberleben nach außerklinischer kardiopulmonaler Reanimation

    Erratum zu: Neurologisches Ergebnis und allgemeiner Gesundheitszustand bei Langzeitüberleben nach außerklinischer kardiopulmonaler Reanimation by Poth, J. M., Buschmann, C. M., Kappler, J., Heister, U., Ehrentraut, S. F., Muenster, S., Diepenseifen, C. J., Ellerkmann, R., Schewe, J.-C.

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