Probing the Variation of the Intervalley Tunnel Coupling in a Silicon Triple Quantum Dot by Borjans, F., Zhang, X., Mi, X., Cheng, G., Yao, N., Jackson, C.A.C., Edge, L.F., Petta, J.R.

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Electronic structure of silicon interfaces with amorphous and epitaxial insulating oxides : Sc2O3, Lu2O3, LaLuO3 by AFANAS' EV, V. V, SHAMUILIA, S, BADYLEVICH, M, STESMANS, A, EDGE, L. F, TIAN, W, SCHLOM, D. G, LOPES, J. M. J, ROECKERATH, M, SCHUBERT, J

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Measurements of Capacitive Coupling Within a Quadruple-Quantum-Dot Array by Neyens, Samuel F., MacQuarrie, E.R., Dodson, J.P., Corrigan, J., Holman, Nathan, Thorgrimsson, Brandur, Palma, M., McJunkin, Thomas, Edge, L.F., Friesen, Mark, Coppersmith, S.N., Eriksson, M.A.

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A study of conduction band edge states in complex oxides by X-ray absorption spectroscopy by Fulton, C.C., Edge, L.F., Lucovsky, G., Lüning, J.

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Spin-Blockade Spectroscopy of Si / Si - Ge Quantum Dots by Jones, A.M., Pritchett, E.J., Chen, E.H., Keating, T.E., Andrews, R.W., Blumoff, J.Z., De Lorenzo, L.A., Eng, K., Ha, S.D., Kiselev, A.A., Meenehan, S.M., Merkel, S.T., Wright, J.A., Edge, L.F., Ross, R.S., Rakher, M.T., Borselli, M.G., Hunter, A.

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Site-Selective Quantum Control in an Isotopically Enriched Si 28 / Si 0.7 Ge 0.3 Quadruple Quantum Dot by Sigillito, A.J., Loy, J.C., Zajac, D.M., Gullans, M.J., Edge, L.F., Petta, J.R.

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Magnetic Gradient Fluctuations from Quadrupolar ^{73}Ge in Si/SiGe Exchange-Only Qubits by J. Kerckhoff, B. Sun, B.H. Fong, C. Jones, A.A. Kiselev, D.W. Barnes, R.S. Noah, E. Acuna, M. Akmal, S.D. Ha, J.A. Wright, B.J. Thomas, C.A.C. Jackson, L.F. Edge, K. Eng, R.S. Ross, T.D. Ladd

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Magnetic Gradient Fluctuations from Quadrupolar 73 Ge in Si / Si Ge Exchange-Only Qubits by Kerckhoff, J., Sun, B., Fong, B.H., Jones, C., Kiselev, A.A., Barnes, D.W., Noah, R.S., Acuna, E., Akmal, M., Ha, S.D., Wright, J.A., Thomas, B.J., Jackson, C.A.C., Edge, L.F., Eng, K., Ross, R.S., Ladd, T.D.

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Fully depleted extremely thin SOI technology fabricated by a novel integration scheme featuring implant-free, zero-silicon-loss, and faceted raised source/drain by Cheng, K., Khakifirooz, A., Kulkarni, P., Kanakasabapathy, S., Schmitz, S., Reznicek, A., Adam, T., Zhu, Y., Li, J., Faltermeier, J., Furukawa, T., Edge, L.F., Haran, B., Seo, S.-C., Jamison, P., Holt, J., Li, X., Loesing, R., Zhu, Z., Johnson, R., Upham, A., Levin, T., Smalley, M., Herman, J., Di, M., Wang, J., Sadana, D., Kozlowski, P., Bu, H., Doris, B., O'Neill, J.

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Electronic structure of silicon interfaces with amorphous and epitaxial insulating oxides: Sc 2O 3, Lu 2O 3, LaLuO 3 by Afanas’ev, V.V., Shamuilia, S., Badylevich, M., Stesmans, A., Edge, L.F., Tian, W., Schlom, D.G., Lopes, J.M.J., Roeckerath, M., Schubert, J.

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Detection of nanocrystallinity by X-ray absorption spectroscopy in thin film transition metal/rare-earth atom, elemental and complex oxides by Edge, L.F., Schlom, D.G., Stemmer, S., Lucovsky, G., Luning, J.

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Extremely thin SOI (ETSOI) CMOS with record low variability for low power system-on-chip applications by Cheng, K., Khakifirooz, A., Kulkarni, P., Ponoth, S., Kuss, J., Shahrjerdi, D., Edge, L.F., Kimball, A., Kanakasabapathy, S., Xiu, K., Schmitz, S., Reznicek, A., Adam, T., He, H., Loubet, N., Holmes, S., Mehta, S., Yang, D., Upham, A., Seo, S.-C., Herman, J.L., Johnson, R., Zhu, Y., Jamison, P., Haran, B.S., Zhu, Z., Vanamurth, L.H., Fan, S., Horak, D., Bu, H., Oldiges, P.J., Sadana, D.K., Kozlowski, P., McHerron, D., O'Neill, J., Doris, B.

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Conduction band-edge States associated with the removal of d-state degeneracies by the Jahn-Teller effect by Lucovsky, G., Fulton, C.C., Zhang, Y., Zou, Y., Luning, J., Edge, L.F., Whitten, J.L., Nemanich, R.J., Ade, H., Schlom, D.G., Afanase'v, V.V., Stesmans, A., Zollner, S., Triyoso, D., Rogers, B.R.

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22 nm technology compatible fully functional 0.1 μm2 6T-SRAM cell by Haran, B.S., Kumar, A., Adam, L., Chang, J., Basker, V., Kanakasabapathy, S., Horak, D., Fan, S., Chen, J., Faltermeier, J., Seo, S., Burkhardt, M., Burns, S., Halle, S., Holmes, S., Johnson, R., McLellan, E., Levin, T.M., Zhu, Y., Kuss, J., Ebert, A., Cummings, J., Canaperi, D., Paparao, S., Arnold, J., Sparks, T., Koay, C.S., Kanarsky, T., Schmitz, S., Petrillo, K., Kim, R.H., Demarest, J., Edge, L.F., Jagannathan, H., Smalley, M., Berliner, N., Cheng, K., LaTulipe, D., Koburger, C., Mehta, S., Raymond, M., Colburn, M., Spooner, T., Paruchuri, V., Haensch, W., McHerron, D., Doris, B.

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Community health impacts after a jet fuel leak contaminated a drinking water system: Oahu, Hawaii, November 2021 by Miko, Shanna, Poniatowski, Alex R, Troeschel, Alyssa N, Felton, Diana J, Banerji, Shireen, Bolduc, Michele L F, Bronstein, Alvin C, Cavanaugh, Alyson M, Edge, Charles, Gates, Abigail L, Jarvis, Madeline, Mintz, Nicole A, Parasram, Vidisha, Rayman, Jamie, Smith, Amanda R, Wagner, Jared C, Gerhardstein, Benjamin G, Orr, Maureen F

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