Search Results - Eggersgluss, S.

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  1. 1
    On Acceleration of SAT-Based ATPG for Industrial Designs

    On Acceleration of SAT-Based ATPG for Industrial Designs by Drechsler, R., Eggersgluss, S., Fey, G., Glowatz, A., Hapke, F., Schloeffel, J., Tille, D.

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  2. 2
    Efficient Data Structures and Methodologies for SAT-Based ATPG Providing High Fault Coverage in Industrial Application

    Efficient Data Structures and Methodologies for SAT-Based ATPG Providing High Fault Coverage in Industrial Application by Eggersgluss, S., Drechsler, R.

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  3. 3
    As-Robust-As-Possible test generation in the presence of small delay defects using pseudo-Boolean optimization

    As-Robust-As-Possible test generation in the presence of small delay defects using pseudo-Boolean optimization by Eggersgluss, S., Drechsler, R.

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  4. 4
    Robust Timing-Aware Test Generation Using Pseudo-Boolean Optimization

    Robust Timing-Aware Test Generation Using Pseudo-Boolean Optimization by Eggersgluss, S., Yilmaz, M., Chakrabarty, K.

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  5. 5
    On the Influence of Boolean Encodings in SAT-Based ATPG for Path Delay Faults

    On the Influence of Boolean Encodings in SAT-Based ATPG for Path Delay Faults by Eggersgluss, S., Drechsler, R.

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  6. 6
    IEEE European Test Symposium (ETS)

    IEEE European Test Symposium (ETS) by Eggersgluss, Stephan, Hamdioui, Said, Jutman, Artur, Michael, Maria K., Raik, Jaan, Reorda, Matteo Sonza, Tahoori, Mehdi, Vatajelu, Elena-Ioana

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  7. 7
    Experimental Studies on SAT-Based ATPG for Gate Delay Faults

    Experimental Studies on SAT-Based ATPG for Gate Delay Faults by Eggersgluss, S., Tille, D., Fey, G., Drechsler, R., Glowatz, A., Hapke, F., Schloffel, J.

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  8. 8
    A Highly Fault-Efficient SAT-Based ATPG Flow

    A Highly Fault-Efficient SAT-Based ATPG Flow by Eggersgluss, S., Drechsler, R.

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  9. 9
    A new SAT-based ATPG for generating highly compacted test sets

    A new SAT-based ATPG for generating highly compacted test sets by Eggersgluss, S., Krenz-Baath, R., Glowatz, A., Hapke, F., Drechsler, R.

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  10. 10
    Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques

    Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques by Eggersgluss, S., Drechsler, R.

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  11. 11
    Structural heuristics for SAT-based ATPG

    Structural heuristics for SAT-based ATPG by Tille, D., Eggersgluss, S., Le, H. M., Drechsler, R.

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  12. 12
    Timing Arc based logic analysis for false noise reduction

    Timing Arc based logic analysis for false noise reduction by Palla, M., Bargfrede, J., Eggersgluss, S., Anheier, W., Drechsler, R.

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  13. 13
    Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults

    Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults by EggersgluB, Stephan, Fey, Gorschwin, Drechsler, Rolf, Glowatz, Andreas, Hapke, Friedrich, Schloeffel, Juergen

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  14. 14
    Towards Complete Fault Coverage by Test Point Insertion using Optimization-SAT Techniques

    Towards Complete Fault Coverage by Test Point Insertion using Optimization-SAT Techniques by Eggersgluss, Stephan

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  15. 15
    A New Static Compaction of Deterministic Test Sets

    A New Static Compaction of Deterministic Test Sets by Eggersgluss, Stephan, Milewski, Sylwester, Rajski, Janusz, Tyszer, Jerzy

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  16. 16
    On Optimization-Based ATPG and Its Application for Highly Compacted Test Sets

    On Optimization-Based ATPG and Its Application for Highly Compacted Test Sets by Eggersgluss, Stephan, Schmitz, Kenneth, Krenz-Baath, Rene, Drechsler, Rolf

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  17. 17
    Incremental Solving Techniques for SAT-based ATPG

    Incremental Solving Techniques for SAT-based ATPG by Tille, Daniel, Eggersgluss, Stephan, Drechsler, Rolf

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  18. 18
    Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test

    Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test by Eggersgluss, Stephan, Holst, Stefan, Tille, Daniel, Miyase, Kohei, Wen, Xiaoqing

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  19. 19
    Optimization of retargeting for IEEE 1149.1 TAP controllers with embedded compression

    Optimization of retargeting for IEEE 1149.1 TAP controllers with embedded compression by Huhn, Sebastian, Eggersgluss, Stephan, Chakrabarty, Krishnendu, Drechsler, Rolf

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  20. 20
    Peak Capture Power Reduction for Compact Test Sets Using Opt-Justification-Fill

    Peak Capture Power Reduction for Compact Test Sets Using Opt-Justification-Fill by Eggersgluss, Stephan

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