Search Results - Eiles, Travis M.

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  1. 1
    Critical timing analysis in microprocessors using near-ir laser assisted device alteration (lada)

    Critical timing analysis in microprocessors using near-ir laser assisted device alteration (lada) by Rowlette, J.A., Eiles, T.M.

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  2. 2
    Combined Josephson and charging behavior of the supercurrent in the superconducting single-electron transistor

    Combined Josephson and charging behavior of the supercurrent in the superconducting single-electron transistor by Eiles, TM, Martinis, JM

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  3. 3
    Coulomb blockade of Andreev reflection in the NSN single-electron transistor

    Coulomb blockade of Andreev reflection in the NSN single-electron transistor by Eiles, Travis M., Devoret, Michel H., Martinis, John M.

    Published in Surface science
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  4. 4
    Coulomb blockade of Andreev reflection in the NSN single-electron transistor

    Coulomb blockade of Andreev reflection in the NSN single-electron transistor by Eiles, Travis M., Devoret, Michel H., Martinis, John M.

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  5. 5
    Even-odd symmetry breaking in the NSN Coulomb blockade electrometer

    Even-odd symmetry breaking in the NSN Coulomb blockade electrometer by Eiles, Travis M., Martinis, John M., Devoret, Michel H.

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  6. 6
    Novel optical probing technique for flip chip packaged microprocessors

    Novel optical probing technique for flip chip packaged microprocessors by Paniccia, M., Eiles, T., Rao, V.R.M., Wai Mun Yee

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