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Commercial hard drive failures in a data center application and the role of SMART attribute information
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Pecht, Michael
,
Elburn, Edmond
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Circuit world
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Evaluating Impact of Information Uncertainties on Component Reliability Assessment
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Das, Diganta
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Elburn, Edmond
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Pecht, Michael
,
Sood, Bhanu
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Conference Proceeding
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Utilization of Data and Models for COTS Part Reliability Assessment
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Elburn, Edmond
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Sood, Bhanu
,
Das, Diganta
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Pecht, Michael
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Support and Development of Workflow Protocols for High Throughput Single-Lap-Joint Testing-Experimental
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Flanagan, David
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DeSchepper,Daniel
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Elburn,Edmond
,
Jensen,Robert
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Support and Development of Workflow Protocols for High Throughput Single-Lap-Joint Testing - Data Management
by
DeSchepper, Daniel
,
Flanagan, David
,
Elburn, Edmond
,
Jensen, Robert
,
Henrie, Benjamin
,
Wimberley, Paul
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