Search Results - Ennos, A.E.

Refine Results
  1. 1
    Look back at the early developments of speckle metrology

    Look back at the early developments of speckle metrology by Ennos, A.E.

    Get full text
    Article
    Save to List
    Saved in:
  2. 2
    Precision measurement of surface form by laser profilometry

    Precision measurement of surface form by laser profilometry by Ennos, A.E., Virdee, M.S.

    Published in Wear
    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  3. 3
    Speckle metrology

    Speckle metrology by Ennos, A.E.

    Get full text
    Article
    Save to List
    Saved in:
  4. 4
    Laser applications in precision measurement

    Laser applications in precision measurement by Ennos, A.E.

    Get full text
    Article
    Save to List
    Saved in:
  5. 5
    A look back at the early developments of Speckle Metrology

    A look back at the early developments of Speckle Metrology by Ennos, A.E.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  6. 6
    Photomechanics and speckle metrology

    Photomechanics and speckle metrology by Ennos, A.E.

    Get full text
    Article
    Save to List
    Saved in:
  7. 7
    Practical holography II

    Practical holography II by Ennos, A.E.

    Get full text
    Article
    Save to List
    Saved in:
  8. 8
    Photomechanics and speckle metrology: Edited by Fu-Pen Chiang SPIE Proceedings, Volume 814, 1988, ISBN 0-89292- 849-4 pp 831, $80 (members, US) $100 (non-members, US) $189 (non-members, elsewhere)

    Photomechanics and speckle metrology: Edited by Fu-Pen Chiang SPIE Proceedings, Volume 814, 1988, ISBN 0-89292- 849-4 pp 831, $80 (members, US) $100 (non-members, US) $189 (non-mem... by Ennos, A.E.

    Get full text
    Article
    Save to List
    Saved in:
  9. 9
    Practical holography II: Edited by T.H. Jeong SPIE Proceedings, Volume 747, 1987, ISBN 0-89252-782-X, pp vi + 151

    Practical holography II: Edited by T.H. Jeong SPIE Proceedings, Volume 747, 1987, ISBN 0-89252-782-X, pp vi + 151 by Ennos, A.E.

    Get full text
    Article
    Save to List
    Saved in:
  10. 10
    Holography: Critical review of technology

    Holography: Critical review of technology by Ennos, A.E.

    Get full text
    Article
    Save to List
    Saved in:
  11. 11
    Holography: Critical review of technology: Edited by L. Huff SPIE Proceedings, Volume 532, 1985, pp 168, $47

    Holography: Critical review of technology: Edited by L. Huff SPIE Proceedings, Volume 532, 1985, pp 168, $47 by Ennos, A.E.

    Get full text
    Article
    Save to List
    Saved in:
  12. 12
    Holographic and speckle interferometry

    Holographic and speckle interferometry by Ennos, A.E.

    Get full text
    Article
    Save to List
    Saved in:
  13. 13
    Holographic and speckle interferometry: R. Jones and C. Wykes Cambridge University Press, 1983, pp xii + 330, £29.50

    Holographic and speckle interferometry: R. Jones and C. Wykes Cambridge University Press, 1983, pp xii + 330, £29.50 by Ennos, A.E.

    Get full text
    Article
    Save to List
    Saved in:
  14. 14
    Interferometry by holography

    Interferometry by holography by Ennos, A.E.

    Get full text
    Article
    Save to List
    Saved in:
  15. 15
    Interferometry by holography

    Interferometry by holography by Ennos, A.E.

    Get full text
    Article
    Save to List
    Saved in:
  16. 16
    Holography: M. Francon Translated by G. M. Spruch, Academic Press, London, 1974, pp xi + 143, £5.30

    Holography: M. Francon Translated by G. M. Spruch, Academic Press, London, 1974, pp xi + 143, £5.30 by Ennos, A.E.

    Get full text
    Article
    Save to List
    Saved in:
  17. 17
    Holography

    Holography by Ennos, A.E.

    Get full text
    Article
    Save to List
    Saved in:
  18. 18
    Speckle phenomena and their applications

    Speckle phenomena and their applications by Ennos, A.E.

    Get full text
    Items that cite this one
    Article
    Save to List
    Saved in:
  19. 19
    Speckle metrology: Edited by Rajpal S. Sirohi Marcel Dekker Inc, 1993, ISBN 0-8247-8932-6, pp 568, $175.00

    Speckle metrology: Edited by Rajpal S. Sirohi Marcel Dekker Inc, 1993, ISBN 0-8247-8932-6, pp 568, $175.00 by Ennos, A.E.

    Get full text
    Review
    Save to List
    Saved in:
  20. 20
    Laser applications in precision measurement: Edited by T. Kemény and K. Havrilla Nova Science, 1987, ISBN 0-941743-38-1, pp 267, $89.00

    Laser applications in precision measurement: Edited by T. Kemény and K. Havrilla Nova Science, 1987, ISBN 0-941743-38-1, pp 267, $89.00 by Ennos, A.E.

    Get full text
    Review
    Save to List
    Saved in:

Search Tools: