Search Results - Erb, Dominik

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  1. 1
    On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits

    On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits by Burchard, Jan, Erb, Dominik, Reddy, Sudhakar M., Singh, Adit D., Becker, Bernd

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  2. 2
    Characterization of possibly detected faults by accurately computing their detection probability

    Characterization of possibly detected faults by accurately computing their detection probability by Burchard, Jan, Erb, Dominik, Becker, Bernd

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  3. 3
    Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPG

    Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPG by Raiola, Pascal, Burchard, Jan, Neubauer, Felix, Erb, Dominik, Becker, Bernd

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  4. 4
    Accurate QBF-Based Test Pattern Generation in Presence of Unknown Values

    Accurate QBF-Based Test Pattern Generation in Presence of Unknown Values by Erb, Dominik, Kochte, Michael A., Reimer, Sven, Sauer, Matthias, Wunderlich, Hans-Joachim, Becker, Bernd

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  5. 5
    Accurate CEGAR-based ATPG in presence of unknown values for large industrial designs

    Accurate CEGAR-based ATPG in presence of unknown values for large industrial designs by Scheibler, Karsten, Erb, Dominik, Becker, Bernd

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  6. 6
    Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model

    Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model by Raiola, Pascal, Erb, Dominik, Reddy, Sudhakar M., Becker, Bernd

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  7. 7
    Exact Logic and Fault Simulation in Presence of Unknowns

    Exact Logic and Fault Simulation in Presence of Unknowns by Erb, Dominik, Kochte, Michael A., Sauer, Matthias, Hillebrecht, Stefan, Schubert, Tobias, Wunderlich, Hans-Joachim, Becker, Bernd

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  8. 8
    Fast and waveform-accurate hazard-aware SAT-based TSOF ATPG

    Fast and waveform-accurate hazard-aware SAT-based TSOF ATPG by Burchard, Jan, Erb, Dominik, Singh, Adit D., Reddy, Sudhakar M., Becker, Bernd

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  9. 9
    Multi-cycle Circuit Parameter Independent ATPG for interconnect open defects

    Multi-cycle Circuit Parameter Independent ATPG for interconnect open defects by Erb, Dominik, Scheibler, Karsten, Sauer, Matthias, Reddy, Sudhakar M., Becker, Bernd

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  10. 10
    Efficient SAT-based generation of hazard-activated TSOF tests

    Efficient SAT-based generation of hazard-activated TSOF tests by Burchard, Jan, Erb, Dominik, Reddy, Sudhakar M., Singh, Adit D., Becker, Bernd

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  11. 11
    Efficient SMT-based ATPG for interconnect open defects

    Efficient SMT-based ATPG for interconnect open defects by Erb, Dominik, Scheibler, Karsten, Sauer, Matthias, Becker, Bernd

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  12. 12
    Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects

    Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects by Erb, Dominik, Scheibler, Karsten, Sauer, Matthias, Reddy, Sudhakar M., Becker, Bernd

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  13. 13
    Accurate QBF-based test pattern generation in presence of unknown values

    Accurate QBF-based test pattern generation in presence of unknown values by Hillebrecht, Stefan, Kochte, Michael A., Erb, Dominik, Wunderlich, Hans-Joachim, Becker, Bernd

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  14. 14
    Accurate Multi-cycle ATPG in Presence of X-Values

    Accurate Multi-cycle ATPG in Presence of X-Values by Erb, Dominik, Kochte, Michael A., Sauer, Matthias, Wunderlich, Hans-Joachim, Becker, Bernd

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  15. 15
    Test pattern generation in presence of unknown values based on restricted symbolic logic

    Test pattern generation in presence of unknown values based on restricted symbolic logic by Erb, Dominik, Scheibler, Karsten, Kochte, Michael A., Sauer, Matthias, Wunderlich, Hans-Joachim, Becker, Bernd

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  16. 16
    The isospin-violating part of the hadronic vacuum polarisation

    The isospin-violating part of the hadronic vacuum polarisation by Erb, Dominik, Gerardin, Antoine, Meyer, Harvey B, Parrino, Julian, Pascalutsa, Vladimir, Biloshytskyi, Volodymyr

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  17. 17
    Improving test pattern generation in presence of unknown values beyond restricted symbolic logic

    Improving test pattern generation in presence of unknown values beyond restricted symbolic logic by Scheibler, Karsten, Erb, Dominik, Becker, Bernd

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  18. 18
    Mixed 01X-RSL-Encoding for fast and accurate ATPG with unknowns

    Mixed 01X-RSL-Encoding for fast and accurate ATPG with unknowns by Erb, Dominik, Scheibler, Karsten, Kochte, Michael A., Sauer, Matthias, Wunderlich, Hans-Joachim, Becker, Bernd

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  19. 19
    Accurate QBF-based test pattern generation in presence of unknown values

    Accurate QBF-based test pattern generation in presence of unknown values by Hillebrecht, Stefan, Kochte, Michael A., Erb, Dominik, Wunderlich, Hans-Joachim, Becker, Bernd

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  20. 20
    A Chemo-Enzymatic Road Map to the Synthesis of CoA Esters

    A Chemo-Enzymatic Road Map to the Synthesis of CoA Esters by Peter, Dominik M, Vögeli, Bastian, Cortina, Niña Socorro, Erb, Tobias J

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