Search Results - Ettisserry, Devanarayanan P.

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    Role of Oxygen Vacancies in Short- and Long-Term Instability of Negative Bias-Temperature Stressed SiC MOSFETs

    Role of Oxygen Vacancies in Short- and Long-Term Instability of Negative Bias-Temperature Stressed SiC MOSFETs by Ettisserry, Devanarayanan P., Goldsman, Neil, Lelis, Aivars J.

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