Search Results - Ewoldt, D.A

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    Spectroscopic photo I–V diagnostics of nitride-based high electron mobility transistor structures on Si wafers

    Spectroscopic photo I–V diagnostics of nitride-based high electron mobility transistor structures on Si wafers by Tong, F, Yapabandara, K, Yang, C.-W, Khanal, M, Jiao, C, Goforth, M, Ozden, B, Ahyi, A, Hamilton, M, Niu, G, Ewoldt, D.A, Chung, G, Park, M

    Published in Electronics letters
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